High-speed phase-stepped digital speckle pattern interferometry using a complementary metal-oxide semiconductor camera

Applied Optics

Volumn 45, Issue 23, 2006, Pages 5845-5855

  Wu, Tao ^a   Jones, Julian D C ^a   Moore, Andrew J ^a  

^a HERIOT WATT UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; DIGITAL DEVICES; MOS DEVICES; NUMERICAL ANALYSIS; SPECKLE;

COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR CAMERAS; HIGH-SPEED PHASE-STEPPED DIGITAL SPECKLE PATTERN INTERFEROMETRY; SURFACE VELOCITY;

INTERFEROMETRY;

EID: 33749866900     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.005845     Document Type: Article

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