Speckle shearography using a multiband light source

Optics and Lasers in Engineering

Volumn 40, Issue 5-6, 2003, Pages 543-552

  Falldorf, C ^a   Osten, W ^a   Kolenovic, E ^a  

^a BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

Author keywords

Interferometry; Optical metrology; Shearography; Speckle; White light

Indexed keywords

IMAGE ANALYSIS; LASERS; MERCURY VAPOR LAMPS; SPECKLE;

SHEAROGRAPHY;

INTERFEROMETRY;

EID: 0038010477     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(02)00080-5     Document Type: Article

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