Surface profiling using shearography

Optical Engineering

Volumn 39, Issue 1, 2000, Pages 23-31

  Shang, H M ^a,b   Hung, Y Y ^a   Luo, W D ^a   Chen, Frank ^a  

^a Oakland University   (United States)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE QUALITY; IMAGING TECHNIQUES;

SHEAROGRAPHY; SURFACE PROFILING;

IMAGE ANALYSIS;

EID: 0033907599     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.602331     Document Type: Article

References (22)

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