SCOPUS 정보 검색 플랫폼

Volumn 186, Issue 4-6, 2000, Pages 259-263

Influence of multiple-exposure recording on curvature pattern using multi-aperture speckle shear interferometry

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; SPECKLE;

MULTI-APERTURE SPECKLE SHEAR INTERFEROMETRY; MULTIPLE-EXPOSURE RECORDING;

OPTICAL RECORDING;

EID: 0034430234 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/S0030-4018(00)01072-5 Document Type: Article

Times cited : (11)

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7
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