Mobile shearography system for the inspection of aircraft and automotive components

Optical Engineering

Volumn 42, Issue 5, 2003, Pages 1188-1196

  Kalms, Michael ^a   Osten, Wolfgang ^b  

^a BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Aircraft; Automotive; Fault detection; Material faults; Non destructive testing; Optical metrology; Shearography; Speckle

Indexed keywords

AUTOMOTIVE ENGINEERING; INSPECTION; NONDESTRUCTIVE EXAMINATION; SPECKLE;

MOBILE SHEAROGRAPHY;

AIRCRAFT;

EID: 0038042512     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1566968     Document Type: Article

References (18)

1. Y. Y. Hung, "Image-shearing camera for direct measurement of surface strains," Appl. Opt. 18, 1046-1051 (1979).
2. Y. Y. Hung, "Shearography for non-destructive evaluation of composite structures," Opt. Lasers Eng. 24, 161-182 (1996).
3. F. Chen, "State of the art of shearography and its applications," in Recent Research Developments in Optical Engineering, S. Pandalai, Ed.
4. W. Osten, M. Kalms, W. Jüptner, G. Tober, W. Bisle, and D. Scherling, "A shearography system for the testing of large scale aircraft components taking into account non-cooperative surfaces," Proc. SPIE 4101B, 432-438 (2000).
5. V. Tornari, A. Bonarou, P. Castellini, E. Esposito, W. Osten, M. Kalms, N. Smyrnakis, and S. Stasinopulos, "Laser based systems for the structural diagnostic of artworks: an application to XVII century Byzantine icons," Proc. SPIE 4402, 172-183 (2001).
6. FringeProcessor 3.6, Software for the automatic evaluation of fringe patterns, BIAS, Bremen, Germany (2002); www.bias.de.
7. W. Osten, W. Jüptner, and U. Mieth, "Knowledge assisted evaluation of fringe patterns for automatic fault detection," Proc. SPIE 2004, 256-268 (1993).
8. M. Kalms, W. Osten, and W. Jüptner, "Scherografie - die Umsetzung des Prinzips in ein mobiles Prufsystem," Tech. Mess. 69, 217-226 (2002).
9. W. Osten, M. Kalms, and W. Jüptner, "Some ways to improve the recognition of imperfections in large scale components using shearography," Proc. SPIE 3745, 244-256 (1999).
10. P. Menn, E. Kolenovic, W. Osten, and W. Jüptner, "Influence of depolarization effects in interferometric measurement methods," Proc. SPIE 4398. 50-60(2001).
11. S. Lauxtermann, "State of the art in CMOS photo sensing and applications in machine vision," Proc. Fringe 2001, pp. 539-548, Elsevier, Paris (2001).
12. J. Laitinen, J. Saviaro, and H. Allisto, "Evaluation of solid-state camera systems in varying illumination conditions," Opt. Eng. 40(6), 896-901 (2001).
13. M. Dubois, M. Choquet, J.-P. Monchalin, F. Enguehard, and L. Bertrand, "Absolute optical absorption spectra in graphite epoxy by Fourier transform infrared photoacoustic spectroscopy," Opt. Eng. 32(9), 2255-2260 (1993).
14. W. Osten, T. Baumbach, C. Falldorf, M. Kalms, and W. Jüptner, "Some progress with the implementation of a shearography system for the testing of technical components," Proc. SPIE 4900, 1299-1309 (2002).
15. D. W. Griffin, "Gaussian beam intensity flattener," Opt. Eng. 37, 2185-2187 (1998).
16. H. Rottenkolber, "Verfahren zur Ermittlung von Verformungen an einem Prüfobjekt mit diffus streuender Oberfläche, insbesondere an Reifen, sowie Vorrichtung zur Durchführung des Verfahrens," Patentschrift DE 42 31 578 C2 (1995).
17. M. K. Kalms, W. Osten, W. Jüptner, W. Bisle, D. Scherling, and G. Tober, "NDT on wide scale aircraft structures with digital speckle shearography," Proc. SPIE 3824, 280-286 (1999).
18. C. Falldorf, W. Osten, E. Kolenovic, and W. Jüptner, "Features of multiband speckle shearography," Proc. SPIE 4900, 1262-1269 (2002).