Double shearography for engineering metrology: Optical and digital approach

Optics and Laser Technology

Volumn 33, Issue 5, 2001, Pages 325-328

  Murukeshan, V M ^a   Keong, Ng Chee ^a   Krishnakumar, V ^a   Seng, Ong Lin ^a   Asundi, A ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Curvature; ESPI; Image processing; Metrology; Shearography

Indexed keywords

BENDING MOMENTS; IMAGE PROCESSING; INTERFEROMETERS; SPECKLE; STRAIN; STRESS ANALYSIS;

DOUBLE SHEAROGRAPHY; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI); MICHELSON INTERFEROMETERS;

INTERFEROMETRY;

EID: 0035398365     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(01)00029-9     Document Type: Article

References (11)

1. Simultaneous measurement of slope and curvature with a three-aperture speckle shearing interferometer
2. Multiple image shearography
3. Double shear speckle interferometry for curvature measurement
4. A selective diffraction order based lens plane grating shearing interferometer for the study of bend plates
5. Measurement of pure curvature fringe distribution using a double whole field filtering technique
6. Curvature measurement using double shear TV holography
7. Measurement of curvature and twist of a deformed object by electronic speckle-shearing pattern interferometry
8. Polarization phase shifting shearography for optical metrological applications
9. Phase shifting speckle interferometry
10. Digital speckle pattern shearing interferometer: Limitations and prospectus
11. Non-destructive evaluation of fiber reinforced polymer composites by an all fiber optic phase shifting electronic speckle pattern interferometer