Simple phase-shifting lateral shearing interferometer

Optics Letters

Volumn 29, Issue 11, 2004, Pages 1264-1266

  Mihaylova, Emilia ^a   Whelan, Maurice ^b   Toal, Vincent ^a  

^a DUBLIN INSTITUTE OF TECHNOLOGY   (Ireland)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC SPECKLES; FRINGE PATTERNS; PHASE CHANGE; REFLECTION COEFFICIENTS;

CAMERAS; CHARGE COUPLED DEVICES; INTERFEROMETERS; LIGHT REFLECTION; NEODYMIUM LASERS; OPTICAL COATINGS; OPTICAL COLLIMATORS; PHASE SHIFT; PHASE TRANSITIONS; PIEZOELECTRIC TRANSDUCERS; SPECKLE;

LASER ABLATION;

EID: 2942587064     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.29.001264     Document Type: Article

References (8)

1. W. Steinchen and L. Yang, Digital Shearography: Theory and Application of Digital Speckle Pattern Shearing Interferometry (SPIE Press, Bellingham, Wash., 2003).
2. R. S. Sirohi, ed., Speckle Metrology (Marcel Dekker, New York, 1993), pp. 99-156.
3. J. C. Wyant, Opt. Commun. 19, 120 (1976).
4. M. Owner-Petersen, J. Opt. Soc. Am. A 8, 1082 (1991).
5. C. M. Vest, Holographic Interferometry (Wiley, New York, 1979).
6. Y. Y. Hung and C. Y. Liang, Appl. Opt. 10, 1046 (1979).
7. P. K. Rastogi, ed., Digital Speckle Pattern Interferometry and Related Techniques (Wiley, New York, 2001).
8. EspiTest Software developed by Andreas Langhoff (http://www.daedalussoft. com) and Maurice Whelan, 1998, European Commission, Joint Research Centre, Ispra, Italy.