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Volumn 24, Issue 5-6, 1996, Pages 403-413

Dual-beam phase shift shearography for measurement of in-plane strains

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAMS; PHASE SHIFT; SHEAR DEFORMATION; STRAIN GAGES; SURFACES;

EID: 0030150199     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00098-4     Document Type: Article
Times cited : (67)

References (13)
  • 1
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    • Shapre, W. N., Jr, Applications of the interferometric strain/displacement gage. Opt. Engng, 21 (1982), 483-488.
    • (1982) Opt. Engng , vol.21 , pp. 483-488
    • Shapre W.N., Jr.1
  • 2
    • 0020134465 scopus 로고
    • Developments in moiré interferometry
    • Post, D., Developments in moiré interferometry. Opt. Engng, 21 (1982), 458-467.
    • (1982) Opt. Engng , vol.21 , pp. 458-467
    • Post, D.1
  • 5
    • 0020133918 scopus 로고
    • Shearography: A new optical method for strain measurement and nondestructive testing
    • May/June
    • Hung, Y. Y., Shearography: a new optical method for strain measurement and nondestructive testing. Opt. Engng, May/June (1982), 391-395.
    • (1982) Opt. Engng , pp. 391-395
    • Hung, Y.Y.1
  • 6
    • 0042660683 scopus 로고
    • A speckle-shearing interferometer
    • Hung, Y. Y., A speckle-shearing interferometer. Opt. Commun., 11 (1974), 732.
    • (1974) Opt. Commun. , vol.11 , pp. 732
    • Hung, Y.Y.1
  • 7
    • 0002745668 scopus 로고
    • An image shearing speckel pattern interferometer for measuring bending moments
    • July
    • Leendertz, J. A. & Butters, J. N., An image shearing speckel pattern interferometer for measuring bending moments. J. Phys. E., July (1974), 168-172.
    • (1974) J. Phys. E. , pp. 168-172
    • Leendertz, J.A.1    Butters, J.N.2
  • 8
    • 30244576214 scopus 로고    scopus 로고
    • Apparatus and method for electronic analysis of test object. US Patent 4,887,899, 1989
    • Hung, Y. Y., Apparatus and method for electronic analysis of test object. US Patent 4,887,899, 1989.
    • Hung, Y.Y.1
  • 9
    • 0011611836 scopus 로고
    • Phase-measurement techniques for nondestructive testing
    • Baltimore, Maryland, 5-8 November
    • Creath, K. Phase-measurement techniques for nondestructive testing. Proc. SEM Conf. on Hologram Interferometry and Speckle Metrology, Baltimore, Maryland, 5-8 November, pp. 473-478, 1990.
    • (1990) Proc. SEM Conf. on Hologram Interferometry and Speckle Metrology , pp. 473-478
    • Creath, K.1
  • 11
    • 0020940715 scopus 로고
    • Two-dimensional fringe pattern analysis
    • Macy, W. W., Two-dimensional fringe pattern analysis. Appl Opt., 22 (1983), 3898.
    • (1983) Appl Opt. , vol.22 , pp. 3898
    • Macy, W.W.1
  • 12
    • 0028493247 scopus 로고
    • Iteration algorithm for computer-aided speckle interferometry
    • Gu, Jie, Hung, Y. Y. & Chen, Fang, Iteration algorithm for computer-aided speckle interferometry. Appl. Opt., 33 (1994).
    • (1994) Appl. Opt. , vol.33
    • Gu, J.1    Hung, Y.Y.2    Chen, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.