Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry

Applied Optics

Volumn 37, Issue 19, 1998, Pages 4116-4122

  Dávila, Abundio ^a   Kaufmann, Guillermo H ^b   Pérez López, Carlos ^a  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b INSTITUTO DE FÍSICA ROSARIO   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER APPLICATIONS; DATA REDUCTION; DEFORMATION; INTERFEROMETERS; INTERFEROMETRY; ITERATIVE METHODS; LASER PULSES; MATHEMATICAL TRANSFORMATIONS;

CARRIER FRINGES; ELECTRONIC SPECKLE SHEARING PATTERN INTERFEROMETRY; SPATIAL SYNCHRONOUS DETECTION METHOD; TRANSIENT DEFORMATION ANALYSIS;

PULSED LASER APPLICATIONS;

EID: 0032122672     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.004116     Document Type: Article

References (12)

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