Multisensor data fusion in dimensional metrology

CIRP Annals - Manufacturing Technology

Volumn 58, Issue 2, 2009, Pages 701-721

  Weckenmann, A ^a   Jiang, X ^b   Sommer, K D ^c   Neuschaefer Rube, U ^c   Seewig, J ^d   Shaw, L ^a   Estler, T ^e  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b UNIVERSITY OF HUDDERSFIELD   (United Kingdom)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^d Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Data fusion; Dimensional metrology; Sensor

Indexed keywords

BAYESIAN FUSION; COMPUTED TOMOGRAPHY; COORDINATE METROLOGY; DATA FUSION PROCESS; DIMENSIONAL METROLOGY; INFORMATION INTEGRATION; MULTIPLE MEASUREMENTS; MULTISENSOR DATA FUSION; OPTICAL MEASURING TECHNIQUES; SCANNING PROBE MICROSCOPE; SENSOR CHARACTERISTICS; SENSOR CONFIGURATIONS; SENSOR TECHNOLOGIES; SINGLE SENSOR; WORK PIECES;

ARTIFICIAL INTELLIGENCE; COMPUTERIZED TOMOGRAPHY; IMAGE FUSION; INFORMATION FUSION; MEASUREMENTS; SENSORS; SIGNAL PROCESSING; TOMOGRAPHY;

SENSOR DATA FUSION;

EID: 70449581036     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2009.09.008     Document Type: Article

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