Large-scale metrology - An update

CIRP Annals - Manufacturing Technology

Volumn 51, Issue 2, 2002, Pages 587-609

  Estler, W T ^a   Edmundson, K L ^b   Peggs, G N ^c   Parker, D H ^d  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Geodetic Services Inc   (United States)

^c NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^d NATIONAL RADIO ASTRONOMY OBSERVATORY   (United States)

Author keywords

Dimensional metrology; Distance measurement; Measurement uncertainty

Indexed keywords

ANGLE MEASUREMENT; DISTANCE MEASUREMENT; PHOTOGRAMMETRY; PRECISION ENGINEERING;

DIMENSIONAL METROLOGY; MEASUREMENT UNCERTAINTY;

DIMENSIONAL STABILITY;

EID: 0036975907     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)61702-8     Document Type: Article

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