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Volumn 48, Issue 6, 2006, Pages 305-311

Application of computed tomography (CT) in reverse-engineering technology;Einsatz von computer-tomographie in der Reverse-Engineering-Technologie

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL GEOMETRY; METAL CASTINGS; OPTICAL SYSTEMS; REVERSE ENGINEERING; SENSOR DATA FUSION; X RAYS;

EID: 33745617926     PISSN: 00255300     EISSN: None     Source Type: Journal    
DOI: 10.3139/120.100208     Document Type: Article
Times cited : (7)

References (7)
  • 2
    • 0012957512 scopus 로고    scopus 로고
    • Industrial computed tomography in reverse engineering applications
    • DGZfP Berichtsband 67-CD, Berlin, 15.-17. März
    • Flisch, A.: Industrial Computed Tomography in Reverse Engineering Applications, DGZfP Berichtsband 67-CD, Int. Symp. on Computerized Tomography, Berlin, 15.-17. März 1999
    • (1999) Int. Symp. on Computerized Tomography
    • Flisch, A.1
  • 3
    • 33745590286 scopus 로고    scopus 로고
    • Einsatz der Computertomographie in der modernen Gießereitechnik
    • Mnich, F.: Einsatz der Computertomographie in der modernen Gießereitechnik. Automotive Engineering Partner 2/2000, S. 62-65
    • (2000) Automotive Engineering Partner , vol.2 , pp. 62-65
    • Mnich, F.1
  • 4
    • 70449620806 scopus 로고    scopus 로고
    • Obtaining dimensional information by industrial CT-scanning - Present and prospective process chain
    • DGZfP-Berichtsband 84-CD, ISBN 3-931381-48-X, Berlin, 23.-25. Juni
    • Saewert, H.-C.; Fiedler, D.; Bartscher, M.; Wäldele, F.: Obtaining dimensional information by industrial CT-scanning - present and prospective process chain, DGZfP-Berichtsband 84-CD, ISBN 3-931381-48-X, Int. Symposium on Computed Tomography and Image Processing, Berlin, 23.-25. Juni 2003
    • (2003) Int. Symposium on Computed Tomography and Image Processing
    • Saewert, H.-C.1    Fiedler, D.2    Bartscher, M.3    Wäldele, F.4
  • 6
    • 9144221364 scopus 로고    scopus 로고
    • Quality control of light metal castings by 3D computed tomography
    • Rome, 15-21 October
    • th WCNDT, Rome, 15-21 October 2000
    • (2000) th WCNDT
    • Simon, M.1    Sauerwein, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.