Automatic high-resolution optoelectronic photogrammetric 3D surface geometry acquisition system

Machine Vision and Applications

Volumn 10, Issue 3, 1997, Pages 98-113

  Hsueh, Wen Jean ^{a,c,d,e,f,g,h}   Antonsson, Erik K ^b,e,h,i  

^a GE GLOBAL RESEARCH   (United States)

^b California Institute of Technology   (United States)

^c INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^d NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^e CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^f Mech Syst Lab GE Corp R and D   (Taiwan)

^g Opto Electronics Syst Labs I   (Taiwan)

^h Department of Obstetrics Gynecology   (United States)

ⁱ MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Active vision; Metrology; Photogrammetry; Range finding; Triangulation

Indexed keywords

ALGORITHMS; DISTANCE MEASUREMENT; IMAGE PROCESSING; OPTOELECTRONIC DEVICES; PHOTOGRAMMETRY; STEREO VISION; SURFACE MEASUREMENT; THREE DIMENSIONAL; TRIANGULATION;

NONCONTACT THREE DIMENSIONAL SURFACE GEOMETRY MEASUREMENT SYSTEM;

PATTERN RECOGNITION SYSTEMS;

EID: 0030688837     PISSN: 09328092     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001380050063     Document Type: Article

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