Registration of tapping and contact mode atomic force microscopy images

2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006

Volumn 1, Issue , 2006, Pages 193-196

  Fan, Y ^a   Chen, Q ^a   Kumar, S A ^a   Baczewski, A D ^a   Tram, N V ^a   Ayres, V M ^a   Udpa, L ^a   Rice, A F ^b  

^a Michigan State University   (United States)

^b Veeco Metrology Group   (United States)

Author keywords

Atomic force microscopy (AFM); Automatic image registration; Contact mode; Tapping mode

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA FUSION; TISSUE;

CONTACTS; FORCE-VOLUME; SCANNED REGIONS; SCANNING TIPS;

IMAGE REGISTRATION;

EID: 42549143560     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nano.2006.247605     Document Type: Conference Paper

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