Multi-sensor integrated automated inspection system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5253, Issue , 2003, Pages 528-531

  Chen, Huacheng ^a   Wang, Boxiong ^a   Luo, Xiuzhi ^a   Liu, Zhenjiang ^a   Ding, Jie ^a   Zhu, Jiqiang ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Automatic inspection system; CMM; Multi sensor; Non contact optical measurement

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COMPUTER AIDED DESIGN; HOLOGRAPHY; INSPECTION; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT;

AUTOMATIC INSPECTION SYSTEMS; FREE-FORM SURFACES; LASER SCANNERS; MULTI-SENSORS;

SENSORS;

EID: 2342526026     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.521835     Document Type: Conference Paper

References (4)

1. Sansoni, G. Biancardi, L., A novel, adaptive system for 3-D optical profilometry using a liquid crystallight projector, IEEE Transactions on Instrumentation and Measurement, Vol. 43, Issue: 4, p. 558-566, 1994
2. V. Carbone M. Carocci E. Savio G. Sansoni L. De Chiffre, Combination of a vision system and a coordinate measuring machine for thereverse engineering of freeform surfaces, vol.17, no.4, p.263-271, 2001
3. Jeffrey A. Jalkio, The use of optical probes on coordinate measuring machines - strengths andweaknesses, Precision Metrology with CMMs, Minneapolis, Minnesota, USA, June 8-9, 1999
4. Kevin Harding, application issues when using optical 3D systems in place of CMMs, SPIE-The International Society for optical Engineering; SPIE Vol.4567, Conference on Machine Vision and Three-Dimensional Imaging Systems forInspection and Metrology II Oct 29-30, 2001, Newton, USA