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Volumn 223, Issue 6, 2009, Pages 571-595

Recent developments in large-scale dimensional metrology

Author keywords

Dimensional metrology; Distance measurement; Measurement uncertainty

Indexed keywords

DIMENSIONAL METROLOGY; INTERNATIONAL STANDARDS; LARGE COMPONENTS; MEASUREMENT DATA; MEASUREMENT TECHNIQUES; MEASUREMENT UNCERTAINTY; MEASURING TECHNIQUE;

EID: 67650705480     PISSN: 09544054     EISSN: None     Source Type: Journal    
DOI: 10.1243/09544054JEM1284     Document Type: Article
Times cited : (211)

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