Multiskalige Mess- und Prüfstrategien in der Mikro- und Nanomesstechnik

VDI Berichte

Volumn , Issue 1950, 2006, Pages 141-150

  Westkämper, Engelbert ^a   Osten, Wolfgang ^a   Regin, Johan ^a   Wiesendanger, Tobias ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846144217     PISSN: 00835560     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (8)

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5. [Rup98] A. Ruprecht: Die Box-Counting-Dimension als Strukturkenngrö ße am Beispiel der Aggregation kolloidaler Hämatit-Teilchen, Diplomarbeit, Forschungseinrichtung Röntgenphysik Georg-August- Universität Göttingen (1998).
6. [Tal94] S. Talibuddin, J.P. Runt, Reliability test of popular fractal techniques applied to small two-dimensional self affine data sets, J. Appl. Phys 76 (9) (1994) 5070-5078.
7. [Yas02] Yasuno, Y., Wiesendanger, T., Ruprecht, A., Tiziani, H., Yatagai, T. "Aberration measurement from confocal axial intensity response using neural network" Optics Express 10, pp. 1451-1457 (2002).
8. [Zit03] B. Zitova and J. Flusser, "Image registration methods: A survey," Image and Vision Computing 21(11), pp. 977-1000, 2003.