Model-based optical metrology and visualization of 3-D complex objects

Optoelectronics Letters

Volumn 3, Issue 2, 2007, Pages 115-118

  Liu, Xiao Li ^a,b   Li, A Meng ^b   Zhao, Xiao Bo ^b   Gao, Peng Dong ^a,b   Tian, Jin Dong ^b   Peng, Xiang ^b  

^a TIANJIN UNIVERSITY   (China)

^b SHENZHEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34547203110     PISSN: 16731905     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11801-007-7018-y     Document Type: Article

References (16)

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