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Volumn 53, Issue 2, 2004, Pages 657-684

Probing systems in dimensional metrology

Author keywords

Coordinate Measuring Machine (CMM); Dimensional Metrology; Probe

Indexed keywords

COORDINATE MEASURING MACHINES; DECISION MAKING; MATHEMATICAL MODELS; MATRIX ALGEBRA; MEASUREMENTS; STANDARDS; STIFFNESS MATRIX; SURFACE TOPOGRAPHY; VAN DER WAALS FORCES; VECTORS; VIBRATIONS (MECHANICAL);

EID: 12144259412     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)60034-1     Document Type: Article
Times cited : (328)

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