X-ray methods for strain and composition analysis in self-organized semiconductor nanostructures

Comptes Rendus Physique

Volumn 6, Issue 1 SPEC. ISS., 2005, Pages 47-59

  Metzger, Till Hartmut ^a   Schülli, Tobias Urs ^a,b   Schmidbauer, Martin ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CEA GRENOBLE   (France)

^c HUMBOLDT UNIVERSITY   (Germany)

Author keywords

Anomalous scattering; Finite element; Nanostructures; Self organization; Semiconductors; Synchrotron radiation; X ray scattering

Indexed keywords

EID: 13744264199     PISSN: 16310705     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.crhy.2004.11.002     Document Type: Short Survey

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