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Volumn 56, Issue 6, 2000, Pages 596-605

On possible extensions of X-ray crystallography through diffraction-pattern oversampling

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; CRYSTAL; DENSITY; DIFFRACTION; PHOTON; RADIATION DOSE; X RAY CRYSTALLOGRAPHY;

EID: 0034495818     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S010876730001031X     Document Type: Article
Times cited : (131)

References (26)
  • 20
    • 0003478334 scopus 로고
    • Direct methods of solving crystal structures
    • edited by H. Schenk, New York: Plenum
    • Sayre, D. (1991). Direct Methods of Solving Crystal Structures, edited by H. Schenk, pp. 353-356. NATO ASI Ser. Ser. B (Physics), Vol. 274. New York: Plenum.
    • (1991) NATO ASI Ser. Ser. B (Physics) , vol.274 , pp. 353-356
    • Sayre, D.1
  • 23
    • 0003855432 scopus 로고    scopus 로고
    • edited by J. Thieme, G. Schmahl, D. Rudolph & E. Umbach, Berlin: Springer-Verlag
    • Schneider, G. & Niemann, B. (1998). X-ray Microscopy and Spectromicroscopy, edited by J. Thieme, G. Schmahl, D. Rudolph & E. Umbach, pp. 25-34. Berlin: Springer-Verlag.
    • (1998) X-ray Microscopy and Spectromicroscopy , pp. 25-34
    • Schneider, G.1    Niemann, B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.