On possible extensions of X-ray crystallography through diffraction-pattern oversampling

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 56, Issue 6, 2000, Pages 596-605

  Miao, J ^a,b   Sayre, D ^a,c  

^a STONY BROOK UNIVERSITY   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; CRYSTAL; DENSITY; DIFFRACTION; PHOTON; RADIATION DOSE; X RAY CRYSTALLOGRAPHY;

EID: 0034495818     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S010876730001031X     Document Type: Article

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