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Volumn 2, Issue 2, 2006, Pages 101-104

Diffractive imaging of highly focused X-ray fields

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; FREE ELECTRON LASERS; IMAGING TECHNIQUES; SPECKLE;

EID: 33646690297     PISSN: 17452473     EISSN: 17452481     Source Type: Journal    
DOI: 10.1038/nphys218     Document Type: Article
Times cited : (184)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.