In situ x-ray scattering study of self-organized nanodot pattern formation on GaSb(001) by ion beam sputtering

Applied Physics Letters

Volumn 91, Issue 11, 2007, Pages

  Plantevin, O ^a,b   Gago, R ^c   Vazquez L ^d   Biermanns, A ^b,e   Metzger, T H ^b  

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^d INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^e UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COARSENING; CORRELATION METHODS; ION BEAMS; SEMICONDUCTING GALLIUM COMPOUNDS; SPUTTERING; X RAY SCATTERING;

GRAZING INCIDENCE; ION BEAM SPUTTERING; NANODOTS; PATTERN FORMATION;

NANOSTRUCTURES;

EID: 34548683473     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2783964     Document Type: Article

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