Composition and atomic ordering of Ge/Si(001) wetting layers

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5587-5592

  Malachias, A ^a,b   Metzger, T H ^a   Stoffel, M ^b   Schmidt, O G ^b   Holy, V ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^c CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Anomalous X ray scattering; Atomic ordering; Grazing incidence diffraction; Wetting layer

Indexed keywords

REFLECTION; SILICON; THIN FILMS; WETTING; X RAY DIFFRACTION; X RAY SCATTERING;

ANOMALOUS X-RAY SCATTERING; ATOMIC ORDERING; GRAZING INCIDENCE DIFFRACTION; WETTING LAYERS;

GERMANIUM;

EID: 34247166253     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.021     Document Type: Article

References (28)

1. Schmidt O.G., and Eberl K. IEEE Tans. Electron Devices 48 (2001) 1175
2. Kar G.S., Kiravittaya S., Denker U., Nguyen B.-Y., and Schmidt O.G. Appl. Phys. Lett. 88 (2006) 253108
3. Eaglesham D.J., and Cerullo M. Phys. Rev. Lett. 64 (1990) 1943
4. Schmidt O.G., Denker U., Christiansen S., and Ernst F. Appl. Phys. Lett. 81 (2002) 2614
5. Denker U., Stoffel M., and Schmidt O.G. Phys. Rev. Lett. 90 (2003) 196102
6. Denker U., Rastelli A., Stoffel M., Tersoff J., Katsaros G., Costantini G., Kern K., Jin-Phillipp N.Y., Jesson D.E., and Schmidt O.G. Phys. Rev. Lett. 94 (2005) 216103
7. Chaparro S.A., Drucker J., Zhang Y., Chandrasekhar D., McCartney M.R., and Smith D.J. Phys. Rev. Lett. 83 (1999) 1199
8. Floyd M., Zhang Y., Driver K.P., Drucker J., Crozier P.A., and Smith D.J. Appl. Phys. Lett. 82 (2003) 1473
9. Malachias A., Kycia S., Medeiros-Ribeiro G., Magalhães-Paniago R., Kamins T.I., and Stanley Williams R. Phys. Rev. Lett. 91 (2003) 176101
10. Schülli T.U., Stangl J., Zhong Z., Lechner R.T., Sztucki M., Metzger T.H., and Bauer G. Phys. Rev. Lett. 90 (2003) 066105
11. Schmidt O.G., Lange C., and Eberl K. Appl. Phys. Lett. 75 (1999) 1905
12. Malachias A., Schülli T.U., Medeiros-Ribeiro G., Cançado L.G., Stoffel M., Schmidt O.G., Metzger T.H., and Magalhães-Paniago R. Phys. Rev., B 72 (2005) 165315
13. Jesson D.E., Pennycook S.J., and Baribeau J.-M. Phys. Rev. Lett. 66 (1991) 750
14. Jesson D.E., Pennycook S.J., Baribeau J.-M., and Houghton D.C. Phys. Rev. Lett. 68 (1992) 2062
15. Jesson D.E., Pennycook S.J., Tischler J.Z., Budai J.D., Baribeau J.-M., and Houghton D.C. Phys. Rev. Lett. 70 (1993) 2093
16. LeGoues F.K., Kesan V.P., Iyer S.S., Tersoff J., and Tromp R. Phys. Rev. Lett. 64 (1990) 2038
17. Tischler J.Z., Budai J.D., Jesson D.E., Eres G., Zscack P., Baribeau J.M., and Houghton D.C. Phys. Rev., B 51 (1995) 10947
18. Reichert H., Moss S.C., Imperatori P., and Evans-lutterodt K. Appl. Phys. Lett. 74 (1999) 531
19. Kesan V.P., LeGoues F.K., and Iyer S.S. Phys. Rev., B 46 (1992) 1576
20. Schülli T.U., Stoffel M., Hesse A., Stangl J., Lechner R.T., Wintersberger E., Sztucki M., Metzger T.H., Schmidt O.G., and Bauer G. Phys. Rev., B 71 (2005) 035326
21. Warren B.E. X-ray Diffraction (1969), Dover Publications
22. Renaud G., Fuoss P.H., Bevk J., and Freer B.S. Phys. Rev., B 45 (1992) 9192
23. Magalhães-Paniago R., Medeiros-Ribeiro G., Malachias A., Kycia S., Kamins T.I., and Williams R.S. Phys. Rev., B 66 (2002) 245312
24. Benarjee S., Sanyal M.K., Datta A., Kanakaraju S., and Mohan S. Phys. Rev., B 54 (1996) 16377
25. Zangenberg N.R., Hansen J.L., Pedersen J.F., and Larsen A.N. Phys. Rev. Lett. 87 (2001) 125901
26. Nurminem L., Tavazza F., Landau D.P., Kuronen A., and Kaski K. Phys. Rev., B 68 (2003) 085326
27. Liou H.K., Mei P., Gennser U., and Yang E.S. Appl. Phys. Lett. 59 (1991) 1200
28. Spadafora M., Privitera G., Terrasi A., Scalese S., Bongiorno C., Carnera A., Di Marino M., and Napolitani E. Appl. Phys. Lett. 83 (2003) 3713