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Volumn 72, Issue 16, 2005, Pages

X-ray study of atomic ordering in self-assembled Ge islands grown on Si(001)

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EID: 29644447182     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.165315     Document Type: Article
Times cited : (50)

References (32)
  • 2
    • 0032561378 scopus 로고    scopus 로고
    • SCIEAS 0036-8075 10.1126/science.282.5389.734
    • G. Springholz, V. Holy, M. Pinczolits, and G. Bauer, Science SCIEAS 0036-8075 10.1126/science.282.5389.734 282, 734 (1998).
    • (1998) Science , vol.282 , pp. 734
    • Springholz, G.1    Holy, V.2    Pinczolits, M.3    Bauer, G.4
  • 9
    • 25344472325 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.37.6983
    • A. Qteish and R. Resta, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.37.6983 37, 6983 (1988).
    • (1988) Phys. Rev. B , vol.37 , pp. 6983
    • Qteish, A.1    Resta, R.2
  • 10
    • 3643058644 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.55.765
    • A. Ourmazd and J. C. Bean, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.55.765 55, 765 (1985).
    • (1985) Phys. Rev. Lett. , vol.55 , pp. 765
    • Ourmazd, A.1    Bean, J.C.2
  • 11
    • 33744639624 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.56.1400
    • J. L. Martins and A. Zunger, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.56.1400 56, 1400 (1986).
    • (1986) Phys. Rev. Lett. , vol.56 , pp. 1400
    • Martins, J.L.1    Zunger, A.2
  • 12
    • 0040174993 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.34.1363
    • P. B. Littlewood, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.34.1363 34, 1363 (1986).
    • (1986) Phys. Rev. B , vol.34 , pp. 1363
    • Littlewood, P.B.1
  • 21
    • 0040769242 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.46.1576
    • V. P. Kesan, F. K. LeGoues, and S. S. Iyer, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.46.1576 46, 1576 (1992).
    • (1992) Phys. Rev. B , vol.46 , pp. 1576
    • Kesan, V.P.1    Legoues, F.K.2    Iyer, S.S.3
  • 24
    • 0001148233 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1342802
    • E. Finkman, F. Meyer, and M. Mamor, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1342802 89, 2580 (2001).
    • (2001) J. Appl. Phys. , vol.89 , pp. 2580
    • Finkman, E.1    Meyer, F.2    Mamor, M.3
  • 30
    • 0035133338 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.63.035318
    • An alternative method to determine heights of iso-lattice parameter regions consists in the analysis of the qz information measured by the PSD detector as discussed by I. Kegel, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.63.035318 63, 035318 (2001). This analysis procedure was applied to the (200) reflection data, exhibiting quantitative agreement with the AFM method.
    • (2001) Phys. Rev. B , vol.63 , pp. 035318
    • Kegel, I.1


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