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Volumn 232, Issue 3, 2008, Pages 395-405

Quantitative HRTEM analysis of FIB prepared specimens

Author keywords

FIB; HRTEM; Intergranular films; Sapphire; Specimen preparation

Indexed keywords

ELECTRONS; FILM PREPARATION; ION BEAMS; IONS; ITERATIVE METHODS; SAPPHIRE; SPECIMEN PREPARATION;

EID: 57449091710     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.02134.x     Document Type: Article
Times cited : (58)

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