The accuracy of quantitative image matching for HRTEM applications

Materials Characterization

Volumn 54, Issue 3, 2005, Pages 194-205

  Kauffmann, Yaron ^a   Rečnik, Aleksander ^b   Kaplan, Wayne D ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

Filtering; Image matching; Quantitative HRTEM

Indexed keywords

COMPUTER SIMULATION; CRYSTALLINE MATERIALS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; OPTIMIZATION; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE ATOMISTIC MODEL; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); QUANTITATIVE IMAGE MATCHING;

PATTERN MATCHING;

EID: 14544306896     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2004.11.012     Document Type: Article

References (25)

1. F. Ernst, and M. Rühle Present developments in high-resolution transmission electron microscopy Curr. Opin. Solid State Mater. Sci. 2 4 1997 469 476
2. G. Möbus Retrieval of crystal defect structures from HREM images by simulated evolution: I. Basic technique Ultramicroscopy 65 1996 205 216
3. G. Möbus, and G. Dehm Retrieval of crystal defect structures from HREM images by simulated evolution: II. Experimental image evaluation Ultramicroscopy 65 1996 217 228
4. G. Möbus, E. Schumann, G. Dehm, and M. Rühle Measurement of coherency states of metal-ceramic interfaces by HRTEM image processing Phys. Status Solidi, A Appl. Res. 150 1995 77 87
5. W.E. King, and G.H. Campbell Determination of thickness and defocus by quantitative comparison of experimental and simulated high-resolution images Ultramicroscopy 51 1993 128 135
6. S. Thoma, and H. Cerva New methods for qualitative and quantitative analysis of the GaAs/AlGaAs interface by high-resolution electron microscopy Ultramicroscopy 38 1991 265 289
7. A. Rosenauer, and D. Gerthsen Composition evaluation by the lattice fringe analysis method using defocus series Ultramicroscopy 76 1999 49 60
8. R. Kilaas, S. Paciornik, A.J. Schwartz, and L.E. Tanner Quantitative analysis of atomic displacements in HRTEM images J. Comput.-Assist. Microsc. 6 3 1994 129 138
9. A. Rosenauer, S. Kaiser, T. Reisinger, J. Zweck, and W. Gebhardt Digital analysis of high resolution transmission electron microscopy lattice images Optik 102 2 1996 63 69
10. G. Möbus, R. Schweinfest, T. Gemming, T. Wagner, and M. Rühle Iterative structure retrieval techniques in HREM: a comparative study and modular program package J. Microsc. 190 1998 109 130
11. O. Kienzel, F. Ernst, and G. Möbus Reliability of atom column positions in a ternary system determined by quantitative high-resolution transmission electron microscopy Microsc. Microanal. Microstruct. 190 1997 144 158
12. A.F. De Jong, W. Coene, and D. Van Dyck Image processing of HRTEM images with non-periodic features Ultramicroscopy 27 1989 53 66
13. G. Nihoul Theoretical image processing of simulated supported particles (1-3 nm) Microsc. Microanal. Microstruct. 2 1991 637 647
14. S. Giorgio, G. Nihoul, C. Chapon, and C.R. Henry Experimental image processing of small supported metallic particles (1-3 nm) Microsc. Microanal. Microstruct. 2 1991 627 636
15. G. Möbus, G. Necker, and M. Rühle Adaptive Fourier-filtering technique for quantitative evaluation of high-resolution electron micrographs of interfaces Ultramicroscopy 49 1993 46 65
16. L.D. Marks Wiener-filter enhancement of noisy HREM images Ultramicroscopy 62 1996 43 52
17. P.A. Stadelmann EMS-a software package for electron diffraction analysis and hREM image simulation in materials science Ultramicroscopy 21 1987 131 146
18. A. Hashibon, J. Adler, M.W. Finnis, and W.D. Kaplan Atomistic study of structural correlations at a liquid-solid interface Comput. Mater. Sci. 24 2002 443 452
19. A. Hashibon, J. Adler, M.W. Finnis, and W.D. Kaplan Ordering at solid-liquid interfaces between dissimilar materials Interface Sci. 9 3-4 2001 175 181
20. F. Ercolessi, and J.B. Adams Interatomic potentials from first-principles calculations: the force-matching method Eur. Phys. Lett. 26 1994 583 588
21. V. Di Gesu, and V. Starovoitov Distance-based functions for image comparison Pattern Recogn. Lett. 20 1999 207 214
22. N. Sebe, and M.S. Lew Toward improved ranking metrics IEEE Trans. Pattern Anal. Mach. Intell. 22 10 2000 1132 1143
23. K. Nadarzinski, and F. Ernst The atomistic structure of a Σ=3, (111) grain boundary in NiAl, studied by quantitative high-resolution transmission electron microscopy Philos. Mag., A 74 1996 641 664
24. G.Y. Fan, and J.M. Cowley The simulation of high resolution images of amorphous thin films Ultramicroscopy 21 1987 125 130
25. G. Mattei, and A.M. Mazzone Analysis of irradiated Ag and Si by molecular dynamics and simulated HREM images Ultramicroscopy 58 1995 223 231