Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross sections for high resolution electron microscopy

Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films

Volumn 19, Issue 3, 2001, Pages 982-985

  Langford, R M ^a   Petford Long, A K ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ELECTRON DIFFRACTION; FOCUSING; HIGH RESOLUTION ELECTRON MICROSCOPY; ION BEAMS; MICROMANIPULATORS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

BROAD ION BEAM MILLING;

COMMINUTION;

EID: 0035334045     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1368198     Document Type: Article

References (20)