Ab-initio HRTEM simulations of ionic crystals: A case study of sapphire

Journal of Microscopy

Volumn 190, Issue 1-2, 1998, Pages 89-98

  Gemming, T ^a   Mobus G ^a   Exner, M ^a   Ernst, F ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Atom form factors; Electron scattering; HRTEM; Image simulation; Ionicity; Sapphire

Indexed keywords

COMPUTER SOFTWARE; CRYSTAL STRUCTURE; ELECTRON SCATTERING; ELECTRONS; IONS; SAPPHIRE;

AB INITIO; ATOM FORM FACTOR; CASE-STUDIES; FORM FACTORS; HRTEM IMAGES; IMAGES SIMULATIONS; IONICITIES; NEUTRAL ATOMS; SCATTERING FACTORS; SIMULATED IMAGES;

ATOMS;

UNCLASSIFIED DRUG;

COMPUTER SIMULATION; CRYSTAL STRUCTURE; DIAGNOSTIC ACCURACY; IMAGE ANALYSIS; MATHEMATICAL COMPUTING; PRIORITY JOURNAL; QUANTITATIVE DIAGNOSIS; REVIEW; SAPPHIRE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031895773     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.3110863.x     Document Type: Review

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