메뉴 건너뛰기




Volumn 155, Issue 9, 2008, Pages

Effects of molybdate concentration on the characteristics of Ni-Mo-P diffusion barriers grown by nonisothermal electroless deposition

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); COPPER; DIFFUSION BARRIERS; ELECTROLESS PLATING; METALLIC COMPOUNDS; MOLYBDENUM; NICKEL; NICKEL ALLOYS; NONMETALS; OPTICAL INTERCONNECTS; PALLADIUM; SILICON; SILICON WAFERS;

EID: 49149103434     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2946729     Document Type: Article
Times cited : (11)

References (41)
  • 2
    • 0030145531 scopus 로고    scopus 로고
    • THSFAP 0040-6090 10.1016/0040-6090(95)08116-X.
    • T. Homma, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(95)08116-X, 278, 28 (1996).
    • (1996) Thin Solid Films , vol.278 , pp. 28
    • Homma, T.1
  • 3
    • 0033358858 scopus 로고    scopus 로고
    • JESOAN 0013-4651 10.1149/1.1392497.
    • J. C. Lin and C. Lee, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1392497, 146, 3466 (1999).
    • (1999) J. Electrochem. Soc. , vol.146 , pp. 3466
    • Lin, J.C.1    Lee, C.2
  • 8
    • 33751418921 scopus 로고    scopus 로고
    • MIENEF 0167-9317 10.1016/j.mee.2006.09.021.
    • K. L. Ou, W. F. Wu, and S. Y. Chiou, Microelectron. Eng. MIENEF 0167-9317 10.1016/j.mee.2006.09.021, 84, 151 (2007).
    • (2007) Microelectron. Eng. , vol.84 , pp. 151
    • Ou, K.L.1    Wu, W.F.2    Chiou, S.Y.3
  • 10
    • 20344407063 scopus 로고    scopus 로고
    • JECMA5 0361-5235 10.1007/s11664-005-0063-z.
    • Y. Wu, C. C. Wan, and Y. Y. Wang, J. Electron. Mater. JECMA5 0361-5235 10.1007/s11664-005-0063-z, 34, 541 (2005).
    • (2005) J. Electron. Mater. , vol.34 , pp. 541
    • Wu, Y.1    Wan, C.C.2    Wang, Y.Y.3
  • 11
    • 0242425804 scopus 로고    scopus 로고
    • JESOAN 0013-4651 10.1149/1.1614799.
    • G. Lu and G. Zangari, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1614799, 150, C777 (2003).
    • (2003) J. Electrochem. Soc. , vol.150 , pp. 777
    • Lu, G.1    Zangari, G.2
  • 20
    • 0037186282 scopus 로고    scopus 로고
    • JALCEU 0925-8388 10.1016/S0925-8388(01)01798-4.
    • K. G. Keong, W. Sha, and S. Malinov, J. Alloys Compd. JALCEU 0925-8388 10.1016/S0925-8388(01)01798-4, 334, 192 (2002).
    • (2002) J. Alloys Compd. , vol.334 , pp. 192
    • Keong, K.G.1    Sha, W.2    Malinov, S.3
  • 23
    • 0031143296 scopus 로고    scopus 로고
    • JESOAN 0013-4651 10.1149/1.1837658.
    • E. J. Podlaha and D. Landolt, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1837658, 144, 1672 (1997).
    • (1997) J. Electrochem. Soc. , vol.144 , pp. 1672
    • Podlaha, E.J.1    Landolt, D.2
  • 26
    • 0242413912 scopus 로고    scopus 로고
    • JMSLD5 0261-8028 10.1023/A:1026107331950.
    • Y. Sung, M. D. Ger, and Y. H. Chou, J. Mater. Sci. Lett. JMSLD5 0261-8028 10.1023/A:1026107331950, 22, 1515 (2003).
    • (2003) J. Mater. Sci. Lett. , vol.22 , pp. 1515
    • Sung, Y.1    Ger, M.D.2    Chou, Y.H.3
  • 27
    • 9944265704 scopus 로고    scopus 로고
    • MCHPDR 0254-0584 10.1016/j.matchemphys.2004.09.018.
    • M. D. Ger, Y. Sung, and J. L. Ou, Mater. Chem. Phys. MCHPDR 0254-0584 10.1016/j.matchemphys.2004.09.018, 89, 383 (2005).
    • (2005) Mater. Chem. Phys. , vol.89 , pp. 383
    • Ger, M.D.1    Sung, Y.2    Ou, J.L.3
  • 29
    • 0033834388 scopus 로고    scopus 로고
    • ECCMF9 1388-2481 10.1016/S1388-2481(99)00137-X.
    • Y. Zeng, Z. Li, M. Ma, and S. Zhou, Electrochem. Commun. ECCMF9 1388-2481 10.1016/S1388-2481(99)00137-X, 2, 36 (2000).
    • (2000) Electrochem. Commun. , vol.2 , pp. 36
    • Zeng, Y.1    Li, Z.2    Ma, M.3    Zhou, S.4
  • 31
  • 32
  • 36
    • 0000129857 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.373566.
    • G. S. Chen and S. T. Chen, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.373566, 87, 8473 (2000).
    • (2000) J. Appl. Phys. , vol.87 , pp. 8473
    • Chen, G.S.1    Chen, S.T.2
  • 38
    • 0037166524 scopus 로고    scopus 로고
    • THSFAP 0040-6090 10.1016/S0040-6090(02)00342-5.
    • C. C. Chang, J. S. Jeng, and J. S. Chen, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(02)00342-5, 413, 46 (2002).
    • (2002) Thin Solid Films , vol.413 , pp. 46
    • Chang, C.C.1    Jeng, J.S.2    Chen, J.S.3
  • 39
    • 0033721452 scopus 로고    scopus 로고
    • THSFAP 0040-6090 10.1016/S0040-6090(00)00926-3.
    • A. Z. Moshfegh and O. Akhavan, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(00)00926-3, 370, 10 (2000).
    • (2000) Thin Solid Films , vol.370 , pp. 10
    • Moshfegh, A.Z.1    Akhavan, O.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.