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Volumn 94, Issue 6, 2003, Pages 3810-3822
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Structure of electroless deposited Co0.9W0.02P 0.08 thin films and their evolution with thermal annealing
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
COBALT;
COBALT COMPOUNDS;
CRYSTALLIZATION;
DIFFUSION;
ELECTROLESS PLATING;
ENCAPSULATION;
GRAIN BOUNDARIES;
MICROELECTRONICS;
MICROSTRUCTURE;
NANOSTRUCTURED MATERIALS;
NUCLEATION;
PHASE TRANSITIONS;
RAPID THERMAL ANNEALING;
SOLID SOLUTIONS;
DIFFUSION BARRIERS;
THIN FILMS;
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EID: 0141921436
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1602572 Document Type: Article |
Times cited : (29)
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References (49)
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