-
1
-
-
0035695312
-
-
C. Goldsmith, J. Ehmke, A. Malczewski, B. Pillans, S. Eshelman, Z. Yao, J. Brank, and M. Eberly, Lifetime characterization of capacitive RF MEMS switches, in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 200.1, pp. 227-230.
-
C. Goldsmith, J. Ehmke, A. Malczewski, B. Pillans, S. Eshelman, Z. Yao, J. Brank, and M. Eberly, "Lifetime characterization of capacitive RF MEMS switches," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 200.1, pp. 227-230.
-
-
-
-
2
-
-
0037153503
-
Measurements of charging in capacitive microelectromechanical switches
-
Nov
-
J. R. Reid and R. T. Webster, "Measurements of charging in capacitive microelectromechanical switches," Electron. Lett., vol. 38, no. 24, pp. 1544-1545, Nov. 2002.
-
(2002)
Electron. Lett
, vol.38
, Issue.24
, pp. 1544-1545
-
-
Reid, J.R.1
Webster, R.T.2
-
3
-
-
0036927888
-
Experimental characterization of stiction due to charging in RF MEMS
-
Dec
-
W. M. van Spengen, R. Puers, R. Mertens, and I. De Wolf, "Experimental characterization of stiction due to charging in RF MEMS," in IEEE Int. Electron Devices Meeting Dig., Dec. 2002, pp. 901-904.
-
(2002)
IEEE Int. Electron Devices Meeting Dig
, pp. 901-904
-
-
van Spengen, W.M.1
Puers, R.2
Mertens, R.3
De Wolf, I.4
-
4
-
-
2342642163
-
A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
-
Jan
-
W. M. van Spengen, R. Puers, R. Mertens, and I. De Wolf, "A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches," J. Micromech. Microeng., vol. 14, pp. 514-521, Jan. 2004.
-
(2004)
J. Micromech. Microeng
, vol.14
, pp. 514-521
-
-
van Spengen, W.M.1
Puers, R.2
Mertens, R.3
De Wolf, I.4
-
5
-
-
4544362468
-
Initial observation and analysis of dielectric-charging effects on RF MEMS capacitive switches
-
Jun
-
X. Yuan, S. V. Cherepko, J. C. M. Hwang, C. L. Goldsmith, C. Nordquist, and C. Dyck, "Initial observation and analysis of dielectric-charging effects on RF MEMS capacitive switches," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2004, pp. 1943-1946.
-
(2004)
IEEE MTT-S Int. Microw. Symp. Dig
, pp. 1943-1946
-
-
Yuan, X.1
Cherepko, S.V.2
Hwang, J.C.M.3
Goldsmith, C.L.4
Nordquist, C.5
Dyck, C.6
-
6
-
-
33644987531
-
Distributed dielectric charging and its impact on RF-MEMS device
-
Oct
-
X. Rottenberg, B. Nauwelaers, W. Raedt, and H. A. C. Tilmans, "Distributed dielectric charging and its impact on RF-MEMS device," in GAAS 12th Symp. Dig., Oct. 2004, pp. 475-478.
-
(2004)
GAAS 12th Symp. Dig
, pp. 475-478
-
-
Rottenberg, X.1
Nauwelaers, B.2
Raedt, W.3
Tilmans, H.A.C.4
-
7
-
-
33646069253
-
Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches
-
Jun
-
X. Yuan, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2005, pp. 753-756.
-
(2005)
IEEE MTT-S Int. Microw. Symp. Dig
, pp. 753-756
-
-
Yuan, X.1
Hwang, J.C.M.2
Forehand, D.3
Goldsmith, C.L.4
-
8
-
-
33746698697
-
Modeling of the dielectric charging kinetic for capacitive RF-MEMS
-
Jun
-
S. Melle, D. De Conto, L. Mazenq, D. Dubuc, K. Grenier, L. Bary, O. Vendier, J. L. Cazaux, and R. Plana, "Modeling of the dielectric charging kinetic for capacitive RF-MEMS," in IEEE MTT-S Int. Miaow. Symp. Dig., Jun. 2005, pp. 757-760.
-
(2005)
IEEE MTT-S Int. Miaow. Symp. Dig
, pp. 757-760
-
-
Melle, S.1
De Conto, D.2
Mazenq, L.3
Dubuc, D.4
Grenier, K.5
Bary, L.6
Vendier, O.7
Cazaux, J.L.8
Plana, R.9
-
9
-
-
33749236096
-
On the dielectric polarization effects in capacitive RF-MEMS switches
-
Jun
-
G. J. Papaioannou, M. Exarchos, V. Theonas, G. Wang, and J. Papapolymerou, "On the dielectric polarization effects in capacitive RF-MEMS switches," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2005, pp. 761-764.
-
(2005)
IEEE MTT-S Int. Microw. Symp. Dig
, pp. 761-764
-
-
Papaioannou, G.J.1
Exarchos, M.2
Theonas, V.3
Wang, G.4
Papapolymerou, J.5
-
10
-
-
28144457995
-
Temperature study of the dielectric polarization effects of capacitive RF-MEMS switches
-
Nov
-
G. J. Papaioannou, M. Exarchos, V. Theonas, G. Wang, and J. Papapolymerou, "Temperature study of the dielectric polarization effects of capacitive RF-MEMS switches," IEEE Trans. Microw. Theory Tech., vol. 53, no. 11, pp. 3467-3473, Nov. 2005.
-
(2005)
IEEE Trans. Microw. Theory Tech
, vol.53
, Issue.11
, pp. 3467-3473
-
-
Papaioannou, G.J.1
Exarchos, M.2
Theonas, V.3
Wang, G.4
Papapolymerou, J.5
-
11
-
-
28144448833
-
Reliability modeling of capacitive RF MEMS
-
Nov
-
S. Melle, D. De Conto, D. Dubuc, K. Grenier, O. Vendier, J. L. Murara, J. L. Cazaux, and R. Plana, "Reliability modeling of capacitive RF MEMS," IEEE Trans. Microw. Theory Tech., vol. 53, no. 11, pp. 3482-3488, Nov. 2005.
-
(2005)
IEEE Trans. Microw. Theory Tech
, vol.53
, Issue.11
, pp. 3482-3488
-
-
Melle, S.1
De Conto, D.2
Dubuc, D.3
Grenier, K.4
Vendier, O.5
Murara, J.L.6
Cazaux, J.L.7
Plana, R.8
-
12
-
-
33749523917
-
-
R. W. Herfst, H. G. A. Huizing, P. G. Steeneken, and J. Schmitz, Characterization of dielectric charging in RF MEMS capacitive switches, in IEEE Int. Microelectron. Test Structures Conf. Dig., Mar. 2006, pp. 133-136.
-
R. W. Herfst, H. G. A. Huizing, P. G. Steeneken, and J. Schmitz, "Characterization of dielectric charging in RF MEMS capacitive switches," in IEEE Int. Microelectron. Test Structures Conf. Dig., Mar. 2006, pp. 133-136.
-
-
-
-
13
-
-
33644988089
-
Non-charge related mechanism, affecting capacitive MEMS switch lifetime
-
Mar
-
J. F. Kcko, J. C. Petrosky, J. R. Reid, and K. Yung, "Non-charge related mechanism, affecting capacitive MEMS switch lifetime," IEEE Microw. Wireless Compon. Lett., vol. 16, no. 3, pp. 140-142, Mar. 2006.
-
(2006)
IEEE Microw. Wireless Compon. Lett
, vol.16
, Issue.3
, pp. 140-142
-
-
Kcko, J.F.1
Petrosky, J.C.2
Reid, J.R.3
Yung, K.4
-
14
-
-
33646881555
-
Effects of dielectric charging on fundamental forces and reliability in capacitive microelectromechanical systems radio frequency switch, contacts
-
May
-
S. Patton and J. Zabinski, "Effects of dielectric charging on fundamental forces and reliability in capacitive microelectromechanical systems radio frequency switch, contacts," J. Appl Phys., vol. 99, no. 9, pp. 1700-1710, May 2006.
-
(2006)
J. Appl Phys
, vol.99
, Issue.9
, pp. 1700-1710
-
-
Patton, S.1
Zabinski, J.2
-
15
-
-
33845528032
-
Temperature Acceleration of dielectric-charging effects in RF MEMS capacitive switches
-
Jun
-
X. Yuan, Z. Peng, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Temperature Acceleration of dielectric-charging effects in RF MEMS capacitive switches," in. IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2006, pp. 47-50.
-
(2006)
IEEE MTT-S Int. Microw. Symp. Dig
, pp. 47-50
-
-
Yuan, X.1
Peng, Z.2
Hwang, J.C.M.3
Forehand, D.4
Goldsmith, C.L.5
-
16
-
-
33748494480
-
Effect of space charge polarization in radio frequency microelectromechanical system capacitive switch dielectric charging
-
Sep
-
G. J. Papaioannou, M. Exarchos, V. Theonas, J. Psychias, G. Konstantinidis, D. Vasilache, A. Muller, and D. Neculoiu, "Effect of space charge polarization in radio frequency microelectromechanical system capacitive switch dielectric charging," Appl Phys. Lett., vol. 89, no. 10, pp. 922-924, Sep. 2006.
-
(2006)
Appl Phys. Lett
, vol.89
, Issue.10
, pp. 922-924
-
-
Papaioannou, G.J.1
Exarchos, M.2
Theonas, V.3
Psychias, J.4
Konstantinidis, G.5
Vasilache, D.6
Muller, A.7
Neculoiu, D.8
-
17
-
-
33748492118
-
Dielectric charge measurements in capacitive microelectromechanical switches
-
Sep
-
D. Molinero, R. Comulada, and L. Castañer, "Dielectric charge measurements in capacitive microelectromechanical switches," J. Appl. Phys., vol. 89, no. 8, pp. 901-903, Sep. 2006.
-
(2006)
J. Appl. Phys
, vol.89
, Issue.8
, pp. 901-903
-
-
Molinero, D.1
Comulada, R.2
Castañer, L.3
-
18
-
-
34748914488
-
A transient SPICE model for dielectric-charging effects in RF MEMS capacitive switches
-
Oct
-
X. Yuan, Z. Peng, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "A transient SPICE model for dielectric-charging effects in RF MEMS capacitive switches," IEEE Trans. Electron Devices, vol. 53, no. 10, pp. 2640-2648, Oct. 2006.
-
(2006)
IEEE Trans. Electron Devices
, vol.53
, Issue.10
, pp. 2640-2648
-
-
Yuan, X.1
Peng, Z.2
Hwang, J.C.M.3
Forehand, D.4
Goldsmith, C.L.5
-
19
-
-
33748074131
-
Charging of radiation induced defects in RF MEMS dielectric films
-
Sep.-Nov
-
M. Exarchos, E. Papandreou, P. Pons, M. Lamhamdi, G. J. Papaioannou, and R. Plana, "Charging of radiation induced defects in RF MEMS dielectric films," Microelectron. Rel., vol. 46, no. 9-11, pp. 1695-1699, Sep.-Nov. 2006.
-
(2006)
Microelectron. Rel
, vol.46
, Issue.9-11
, pp. 1695-1699
-
-
Exarchos, M.1
Papandreou, E.2
Pons, P.3
Lamhamdi, M.4
Papaioannou, G.J.5
Plana, R.6
-
20
-
-
33747756123
-
Charging-effects in RF capacitive switches influence of insulating layers composition
-
Sep.-Nov
-
M. Lamhamdi, J. Guastavino, L. Boudou, Y. Segui, P. Pons, L. Bouscayrol, and R. Plana, "Charging-effects in RF capacitive switches influence of insulating layers composition," Microelectron. Rel., vol. 46, no. 9-1.1, pp. 1700-1704, Sep.-Nov. 2006.
-
(2006)
Microelectron. Rel
, vol.46
, Issue.9 -1.1
, pp. 1700-1704
-
-
Lamhamdi, M.1
Guastavino, J.2
Boudou, L.3
Segui, Y.4
Pons, P.5
Bouscayrol, L.6
Plana, R.7
-
21
-
-
33845524032
-
Acceleration of dielectric charging in RF MEMS capacitive switches
-
Dec
-
X. Yuan, Z. Peng, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Acceleration of dielectric charging in RF MEMS capacitive switches," IEEE Trans. Device Mater: Rel., vol. 6, no. 4, pp. 556-563, Dec. 2006.
-
(2006)
IEEE Trans. Device Mater: Rel
, vol.6
, Issue.4
, pp. 556-563
-
-
Yuan, X.1
Peng, Z.2
Hwang, J.C.M.3
Forehand, D.4
Goldsmith, C.L.5
-
22
-
-
44949239556
-
Top versus bottom charging of dielectric in RF MEMS capacitive switches
-
Dec
-
Z. Peng, X. Yuan, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Top versus bottom charging of dielectric in RF MEMS capacitive switches," in. Proc Asia-Pacific Microw. Conf., Dec. 2006, pp. 1535-1539.
-
(2006)
Proc Asia-Pacific Microw. Conf
, pp. 1535-1539
-
-
Peng, Z.1
Yuan, X.2
Hwang, J.C.M.3
Forehand, D.4
Goldsmith, C.L.5
-
23
-
-
34547261882
-
Investigation of suction effect in electrostatic actuated RF MEMS devices
-
Jan
-
S. Melle, C. Bordas, D. Dubuc, K. Grenier, O. Vendier, J. L. Muraro, J. L. Cazaux, and R. Plana, "Investigation of suction effect in electrostatic actuated RF MEMS devices," in SiRF Top. Meeting Dig., Jan. 2007, pp. 173-176.
-
(2007)
SiRF Top. Meeting Dig
, pp. 173-176
-
-
Melle, S.1
Bordas, C.2
Dubuc, D.3
Grenier, K.4
Vendier, O.5
Muraro, J.L.6
Cazaux, J.L.7
Plana, R.8
-
24
-
-
34748830320
-
High-cycle life testing of RF MEMS switches
-
Jun
-
C. L. Goldsmith, D. I. Forehand, Z. Peng, J. C. M. Hwang, and J. L. Ebel, "High-cycle life testing of RF MEMS switches," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2007, pp. 1805-1808.
-
(2007)
IEEE MTT-S Int. Microw. Symp. Dig
, pp. 1805-1808
-
-
Goldsmith, C.L.1
Forehand, D.I.2
Peng, Z.3
Hwang, J.C.M.4
Ebel, J.L.5
-
25
-
-
34748871396
-
Dielectric charging of RF MEMS capacitive switches under bipolar control-voltage waveforms
-
Jun
-
Z. Peng, X. Yuan, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Dielectric charging of RF MEMS capacitive switches under bipolar control-voltage waveforms," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2007, pp. 1817-1820.
-
(2007)
IEEE MTT-S Int. Microw. Symp. Dig
, pp. 1817-1820
-
-
Peng, Z.1
Yuan, X.2
Hwang, J.C.M.3
Forehand, D.4
Goldsmith, C.L.5
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