메뉴 건너뛰기




Volumn 3, Issue , 2006, Pages 1535-1538

Top vs. bottom charging of the dielectric in RF MEMS capacitive switches

Author keywords

Charging; Dielectric; RF MEMS; Switch; Trap

Indexed keywords

ENERGY STORAGE; METALLIZING; MICROWAVES; TIME SWITCHES;

EID: 44949239556     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APMC.2006.4429698     Document Type: Conference Paper
Times cited : (44)

References (16)
  • 4
    • 0037153503 scopus 로고    scopus 로고
    • Measurements of charging in capacitive Microelectromechanical switches
    • Nov
    • J. R. Reid, and R. T. Webster, "Measurements of charging in capacitive Microelectromechanical switches," Electron. Lett., vol. 38, no. 24, pp. 1544-1545, Nov. 2002.
    • (2002) Electron. Lett , vol.38 , Issue.24 , pp. 1544-1545
    • Reid, J.R.1    Webster, R.T.2
  • 6
    • 2342642163 scopus 로고    scopus 로고
    • A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
    • Jan
    • W. M. van Spengen, R. Puers, R. Mertens, and I. De Wolf "A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches," J. Micromech. Microeng., vol. 14, pp. 514-521, Jan. 2004.
    • (2004) J. Micromech. Microeng , vol.14 , pp. 514-521
    • van Spengen, W.M.1    Puers, R.2    Mertens, R.3    De Wolf, I.4
  • 10
    • 33646069253 scopus 로고    scopus 로고
    • Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches
    • June
    • X. Yuan, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches," IEEE MTT-S Int. Microwave Symp. Dig., pp. 753-756, June 2005.
    • (2005) IEEE MTT-S Int. Microwave Symp. Dig , pp. 753-756
    • Yuan, X.1    Hwang, J.C.M.2    Forehand, D.3    Goldsmith, C.L.4
  • 15
    • 33644988089 scopus 로고    scopus 로고
    • Non-charge related mechanism affecting capacitive MEMS switch lifetime
    • Mar
    • J. F. Kcko, J. C. Petrosky, J. R. Reid and K. Yung, "Non-charge related mechanism affecting capacitive MEMS switch lifetime," IEEE Microwave Wireless Components Lett., vol. 16, no. 3, pp. 140-142, Mar. 2006.
    • (2006) IEEE Microwave Wireless Components Lett , vol.16 , Issue.3 , pp. 140-142
    • Kcko, J.F.1    Petrosky, J.C.2    Reid, J.R.3    Yung, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.