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Lifetime characterization of capacitive RF MEMS switches
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Goldsmith, C.1
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Measurements of charging in capacitive microelectromechanical switches
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Experimental characterization of stiction due to charging in RF MEMS
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van Spengen, W.M.1
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A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
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Initial observation and analysis of dielectric-charging effects on RF MEMS capacitive switches
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June
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X. Yuan, S. V. Cherepko, J. C. M. Hwang, C. L. Goldsmith, C. Nordquist, and C. Dyck, "Initial observation and analysis of dielectric-charging effects on RF MEMS capacitive switches," IEEE MTT-S Int. Microwave Symp. Dig., pp. 1943-1946, June 2004.
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IEEE MTT-S Int. Microwave Symp. Dig
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Yuan, X.1
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Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches
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June
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X. Yuan, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches," IEEE MTT-S Int. Microwave Symp. Dig., pp. 753-756, June 2005.
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Modeling of the dielectric charging kinetic for capacitive RF-MEMS
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June
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S. Melle, D. De Conto, L. Mazenq, D. Dubuc, K. Grenier, L. Bary, O. Vendier, J. L. Cazaux, and R. Plana, "Modeling of the dielectric charging kinetic for capacitive RF-MEMS," IEEE MTT-S Int. Microwave Symp. Dig., pp. 757-760, June 2005.
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On the dielectric polarization effects in capacitive RF-MEMS switches
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June
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G. J. Papaioannou, M. Exarchos, V. Theonas, G. Wang, and J. Papapolymerou, "On the dielectric polarization effects in capacitive RF-MEMS switches," IEEE MTT-S Int. Microwave Symp. Dig., pp. 761-764, June 2005.
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Temperature study of the dielectric polarization effects of capacitive RF-MEMS switches
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Nov
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G. J. Papaioannou, M. Exarchos, V. Theonas, G. Wang, and J. Papapolymerou, "Temperature study of the dielectric polarization effects of capacitive RF-MEMS switches," IEEE Trans. Microwave Theory Techniques, vol. 53, no. 11, pp. 3467-3473, Nov. 2005.
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Reliability modeling of capacitive RF MEMS
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Nov
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S. Melle, D. De Conto, D. Dubuc, K. Grenier, O. Vendier, J. L. Muraro, J. L. Cazaux, and R. Plana, "Reliability modeling of capacitive RF MEMS," IEEE Trans. Microwave Theory Techniques, vol. 53, no. 11, pp. 3482-3488, Nov. 2005.
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Characterization of dielectric charging in RF MEMS capacitive switches
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Mar
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R. W. Herfst, H. G. A. Huizing, P. G. Steeneken, and J. Schmitz, "Characterization of dielectric charging in RF MEMS capacitive switches," Dig. IEEE Int. Conf. Microelectronic Test Structures, pp. 133-136, Mar. 2006.
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Effects of dielectric charging on fundamental forces and reliability in capacitive microelectromechanical systems radio frequency switch contacts
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S. Patton, and J. Zabinski, "Effects of dielectric charging on fundamental forces and reliability in capacitive microelectromechanical systems radio frequency switch contacts," J. Appl. Phys., vol. 99, issue 9, pp. 1700-1710, May. 2006.
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Temperature Acceleration of dielectric-charging effects in RF MEMS capacitive switches
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June
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X. Yuan, Z. Peng, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Temperature Acceleration of dielectric-charging effects in RF MEMS capacitive switches," IEEE MTT-S Int. Microwave Symp. Dig., pp. 47-50, June 2006.
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Yuan, X.1
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Effect of space charge polarization in radio frequency microelectromechanical system capacitive switch dielectric charging
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Sep
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G. J. Papaioannou, M. Exarchos, V. Theonas, J. Psychias, G. Konstantinidis, D. Vasilache, A. Muller, and D. Neculoiu, "Effect of space charge polarization in radio frequency microelectromechanical system capacitive switch dielectric charging," Appl. Phys. Lett., vol. 89, issue 10, pp. 922-924, Sep. 2006.
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X. Yuan, Z. Peng, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "A transient SPICE model for dielectric-charging effects in RF MEMS capacitive switches," IEEE Trans. Electron Devices, vol. 53, no. 10, pp. 2640-2648, Oct. 2006.
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Charging of radiation induced defects in RF MEMS dielectric films
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M. Exarchos, E. Papandreou, P. Pons, M. Lamhamdi, G. J. Papaioannou, and R. Plana, "Charging of radiation induced defects in RF MEMS dielectric films," Microelectronics Reliability, vol. 46, issue 9-11, pp. 1695-1699, Sep-Nov. 2006.
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Z. Peng, X. Yuan, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Top vs. bottom charging of dielectric in RF MEMS capacitive switches," Proc. 2006 Asia Pacific Microwave Conf., Dec. 2006.
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