-
1
-
-
0034514764
-
RF MEMS from a device perspective
-
J J Yao, "RF MEMS from a device perspective" J. Micromech. Microeng. 10, pp. R9, (2000).
-
(2000)
J. Micromech. Microeng.
, vol.10
-
-
Yao, J.J.1
-
2
-
-
0035695312
-
Lifetime characterization of capacitive RF MEMS switches
-
C L Goldsmith, J Ehmke, A Malczewski, B Pillans, S Eshelman, Z Yao, J Brank and M Eberly, "Lifetime characterization of capacitive RF MEMS switches" IEEE MTT-S Int. Microwave Symp. Digest 2000, pp. 227.
-
IEEE MTT-S Int. Microwave Symp. Digest 2000
, pp. 227
-
-
Goldsmith, C.L.1
Ehmke, J.2
Malczewski, A.3
Pillans, B.4
Eshelman, S.5
Yao, Z.6
Brank, J.7
Eberly, M.8
-
5
-
-
0032208481
-
Parasitic charging of dielectric surfaces in capacitive microelectromechanical systems (MEMS)
-
J Wibbeler, G Pfeifer and M Hietschold, "Parasitic charging of dielectric surfaces in capacitive microelectromechanical systems (MEMS)", SensorsActuators A 71, pp.74, (1998).
-
(1998)
SensorsActuators A
, vol.71
, pp. 74
-
-
Wibbeler, J.1
Pfeifer, G.2
Hietschold, M.3
-
6
-
-
2342642163
-
A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
-
W Merlijn van Spengen, Robert Puers, Robert Mertens and Ingrid de Wolf, "A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches", J. Micromech. Microeng. 14, pp.514, (2004).
-
(2004)
J. Micromech. Microeng.
, vol.14
, pp. 514
-
-
Merlijn Van Spengen, W.1
Puers, R.2
Mertens, R.3
De Wolf, I.4
-
7
-
-
4544362468
-
Initial observation and analysis of dielectric-charging effects on RF MEMS capacitive switches
-
X. Yuan, S. Cherepko, J. Hwang, C. I. Goldsmith, C. Nordquist and C. Dyck, "Initial Observation and Analysis of Dielectric-Charging Effects on RF MEMS Capacitive Switches", IEEE MTT-S Int. Microwave Symp. Digest 2004, pp. 1943.
-
IEEE MTT-S Int. Microwave Symp. Digest 2004
, pp. 1943
-
-
Yuan, X.1
Cherepko, S.2
Hwang, J.3
Goldsmith, C.I.4
Nordquist, C.5
Dyck, C.6
-
8
-
-
36549102051
-
Electrically active point defects in amorphous silicon nitride: An illumination and charge injection study
-
D T Krick, P. M. Lenahan and J. Kanicki, Electrically active point defects in amorphous silicon nitride: an illumination and charge injection study", J. Appl. Phys. Vol. 64, no. 7, pp. 3558, (1988).
-
(1988)
J. Appl. Phys.
, vol.64
, Issue.7
, pp. 3558
-
-
Krick, D.T.1
Lenahan, P.M.2
Kanicki, J.3
-
9
-
-
33749236563
-
Methodology to assess the reliability behavior of RFMEMS
-
D. Dubuc, M. Van Spengen, S. Melle, I. De Wolf, R. Mertens, P. Pons, K. Grenier and R. Plana, "Methodology to assess the reliability behavior of RFMEMS", European Microwave Week GAAS 2004, pp.459.
-
European Microwave Week GAAS 2004
, pp. 459
-
-
Dubuc, D.1
Van Spengen, M.2
Melle, S.3
De Wolf, I.4
Mertens, R.5
Pons, P.6
Grenier, K.7
Plana, R.8
-
11
-
-
5244221149
-
-
R. G. Palmer, D. L. Stein, E. Abrahams and P. W. Anderson, Phys. Rev. Letters 53, pp. 958, (1984).
-
(1984)
Phys. Rev. Letters
, vol.53
, pp. 958
-
-
Palmer, R.G.1
Stein, D.L.2
Abrahams, E.3
Anderson, P.W.4
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