메뉴 건너뛰기




Volumn 2005, Issue , 2005, Pages 761-764

On the dielectric polarization effects in capacitive RF-MEMS switches

Author keywords

Dielectric charging; Polarization effects; Reliability; RF MEMS switches

Indexed keywords

CAPACITORS; DIELECTRIC PROPERTIES; DIELECTRIC RELAXATION; ELECTRIC CHARGE; ELECTRIC POTENTIAL; ELECTRIC SWITCHES; POLARIZATION;

EID: 33749236096     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2005.1516723     Document Type: Conference Paper
Times cited : (22)

References (14)
  • 1
    • 0034514764 scopus 로고    scopus 로고
    • RF MEMS from a device perspective
    • J J Yao, "RF MEMS from a device perspective" J. Micromech. Microeng. 10, pp. R9, (2000).
    • (2000) J. Micromech. Microeng. , vol.10
    • Yao, J.J.1
  • 5
    • 0032208481 scopus 로고    scopus 로고
    • Parasitic charging of dielectric surfaces in capacitive microelectromechanical systems (MEMS)
    • J Wibbeler, G Pfeifer and M Hietschold, "Parasitic charging of dielectric surfaces in capacitive microelectromechanical systems (MEMS)", SensorsActuators A 71, pp.74, (1998).
    • (1998) SensorsActuators A , vol.71 , pp. 74
    • Wibbeler, J.1    Pfeifer, G.2    Hietschold, M.3
  • 6
    • 2342642163 scopus 로고    scopus 로고
    • A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
    • W Merlijn van Spengen, Robert Puers, Robert Mertens and Ingrid de Wolf, "A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches", J. Micromech. Microeng. 14, pp.514, (2004).
    • (2004) J. Micromech. Microeng. , vol.14 , pp. 514
    • Merlijn Van Spengen, W.1    Puers, R.2    Mertens, R.3    De Wolf, I.4
  • 8
    • 36549102051 scopus 로고
    • Electrically active point defects in amorphous silicon nitride: An illumination and charge injection study
    • D T Krick, P. M. Lenahan and J. Kanicki, Electrically active point defects in amorphous silicon nitride: an illumination and charge injection study", J. Appl. Phys. Vol. 64, no. 7, pp. 3558, (1988).
    • (1988) J. Appl. Phys. , vol.64 , Issue.7 , pp. 3558
    • Krick, D.T.1    Lenahan, P.M.2    Kanicki, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.