Atomic resolution analytical microscopy

IBM Journal of Research and Development

Volumn 44, Issue 4, 2000, Pages 477-487

  Batson, P E ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; ELECTRONIC STRUCTURE; IMAGE QUALITY; MICROELECTRONICS; SCANNING ELECTRON MICROSCOPY;

ATOMIC RESOLUTION ANALYTICAL MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034229694     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.444.0477     Document Type: Article

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