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Volumn 100, Issue 3-4, 2004, Pages 421-427
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Towards phonon photonics: Scattering-type near-field optical microscopy reveals phonon-enhanced near-field interaction
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Author keywords
07.09.Fc; 19,38,49; 73.29.Mf; 78.67. n; Infrared microscopy; Phonon resonance; s SNOM; Scattering type near field optical microscopy; Surface phonon polaritons; Surface plasmon polaritons
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Indexed keywords
DIFFRACTION;
LIGHT SCATTERING;
NANOSTRUCTURED MATERIALS;
OPTICAL RESOLVING POWER;
RESONANCE;
ATOMIC FORCE MICROSCOPES (ATM);
CLASSICAL MICROSCOPY;
DIFFRACTION LIMITS;
SPATIAL RESOLUTION;
OPTICAL MICROSCOPY;
METAL;
SILICON DERIVATIVE;
ATOMIC FORCE MICROSCOPY;
CONFERENCE PAPER;
CRYSTAL;
DIFFRACTION;
ILLUMINATION;
INFRARED RADIATION;
MOLECULAR INTERACTION;
MOLECULAR PROBE;
PHONON;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
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EID: 3042661998
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2003.11.017 Document Type: Conference Paper |
Times cited : (48)
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References (28)
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