Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600

Optics Letters

Volumn 21, Issue 17, 1996, Pages 1315-1317

  Lahrech, A ^a   Bachelot, R ^a   Gleyzes, P ^a   Boccara, A C ^a  

^a INSTITUT LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001040403     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.001315     Document Type: Article

References (12)

1. D. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 44, 651 (1984).
2. U. Dürig, D. W. Pohl, and F. Rohner, J. Appl. Phys. 59, 3318 (1986).
3. E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, Science 251, 1468 (1991).
4. E. Betzig and J. K. Trautman, Science 257, 189 (1992).
5. E. Betzig, M. Isaacson, and A. Lewis, Appl. Phys. Lett. 51, 2088 (1987).
6. R. Bachelot, P. Gleyzes, and A. C. Boccara, Microscopy Microanalysis Microstructures 5, 389 (1994).
7. M. Specht, J. D. Pedarnig, W. M. Heckl, and T. W. Hänsch, Phys. Rev. Lett. 68, 476 (1992).
8. F. Zenhausern, Y. Martin, and H. K. Wickramasinghe, Science 269, 1083 (1995).
9. R. Bachelot, P. Gleyzes, and A. C. Baccara, Opt. Lett. 20, 1924 (1995).
10. D. Courjon, K. Sarayeddine, and M. Spajer, Opt. Commun. 71, 23 (1989).
11. F. DeFornel, E. Lesniewska, L. Salomon, and J. P. Goudonnet, Opt. Commun. 102, 1 (1993).
12. J. A. Cline and M. Isaacson, Appl. Opt. 34, 4869 (1995).