DC-conduction mechanism in crystalline oxidised La and La-Mn films grown on p-Si substrate

Journal of Alloys and Compounds

Volumn 433, Issue 1-2, 2007, Pages 6-10

  Dakhel, A A ^a  

^a UNIVERSITY OF BAHRAIN   (Bahrain)

Author keywords

Dielectric phenomena; Insulating films; Lanthana; Lanthanum manganese oxide; Metallic conduction behaviour of insulators; Richardson Schottky mechanism

Indexed keywords

CRYSTAL STRUCTURE; DIFFERENTIAL EQUATIONS; LANTHANUM COMPOUNDS; LEAKAGE CURRENTS; PERMITTIVITY; SILICON; X RAY DIFFRACTION;

DIELECTRIC PHENOMENA; INSULATING FILMS; LANTHANUM-MANGANESE OXIDE; METALLIC-CONDUCTION BEHAVIOR OF INSULATORS; RICHARDSON-SCHOTTKY MECHANISM;

OXIDE FILMS;

EID: 33947121150     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.06.046     Document Type: Article

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