Tip-surface interactions in atomic force microscopy: Reactive vs. metallic surfaces

Applied Surface Science

Volumn 188, Issue 3-4, 2002, Pages 325-330

  Stich I ^a   Dieska P ^a   Perez R ^b  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Density functional calculations; Non contact AFM; Tip surface interactions

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; MORPHOLOGY; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING INDIUM PHOSPHIDE;

METALLIC SURFACES; SURFACE CORRUGATION;

SURFACE CHEMISTRY;

EID: 0037187205     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00945-X     Document Type: Conference Paper

References (27)