-
1
-
-
84951490594
-
1-x, as heterojunctions
-
1-x, as heterojunctions," Japan J. Appl. Phys., vol. 19, no. 5, pp. L225-L227, 1980.
-
(1980)
Japan J. Appl. Phys.
, vol.19
, Issue.5
-
-
Mimura, T.1
Hiyamizu, S.2
Fujii, T.3
Nanbu, K.4
-
2
-
-
0019047098
-
Two-dimensional electron gas MESFET structure
-
Aug.
-
D. Delagebeaudeuf, P. Delescluse, P. Etienne, M. Laviron, J. Chaplart, and N. T. Linh, "Two-dimensional electron gas MESFET structure," Electron. Lett., vol. 16, no. 17, pp. 667-668, Aug. 1980.
-
(1980)
Electron. Lett.
, vol.16
, Issue.17
, pp. 667-668
-
-
Delagebeaudeuf, D.1
Delescluse, P.2
Etienne, P.3
Laviron, M.4
Chaplart, J.5
Linh, N.T.6
-
3
-
-
0037291685
-
A 110-GHz large-signal lookup-table model for InP HEMTs including impact ionization effects
-
Feb.
-
A. Orzati, D. Schreurs, L. Pergola, H. Benedickter, F. Robin, O. Homan, and W. Bächtold, "A 110-GHz large-signal lookup-table model for InP HEMTs including impact ionization effects," IEEE Trans. Microw. Theory Tech., vol. 51, no. 2, pp. 468-474, Feb. 2003.
-
(2003)
IEEE Trans. Microw. Theory Tech.
, vol.51
, Issue.2
, pp. 468-474
-
-
Orzati, A.1
Schreurs, D.2
Pergola, L.3
Benedickter, H.4
Robin, F.5
Homan, O.6
Bächtold, W.7
-
4
-
-
0024048518
-
A new method for determining the FET small-signal equivalent circuit
-
Jul.
-
G. Dambrine, A. Cappy, F. Heliodore, and E. Playez, "A new method for determining the FET small-signal equivalent circuit," IEEE Trans. Microw. Theory Tech., vol. 36, no. 7, pp. 1151-1159, Jul. 1988.
-
(1988)
IEEE Trans. Microw. Theory Tech.
, vol.36
, Issue.7
, pp. 1151-1159
-
-
Dambrine, G.1
Cappy, A.2
Heliodore, F.3
Playez, E.4
-
5
-
-
28144456249
-
A new small signal modeling approach applied to GaN devices
-
Nov.
-
A. Jarndal and G. Kompa, "A new small signal modeling approach applied to GaN devices," IEEE Trans. Microw. Theory Tech., vol. 53, no. 11, pp. 3440-3448, Nov. 2005.
-
(2005)
IEEE Trans. Microw. Theory Tech.
, vol.53
, Issue.11
, pp. 3440-3448
-
-
Jarndal, A.1
Kompa, G.2
-
6
-
-
0034594104
-
Determination of small signal parameters of GaN based HEMTs
-
Aug.
-
E. Chigaeva, W. Walthes, D. Wiegner, M. Grozing, F. Schaich, and N. Wieser, "Determination of small signal parameters of GaN based HEMTs," in Proc. IEEE/Cornell High-Performance Devices Conf., Aug. 2000, pp. 115-122.
-
(2000)
Proc. IEEE/Cornell High-Performance Devices Conf.
, pp. 115-122
-
-
Chigaeva, E.1
Walthes, W.2
Wiegner, D.3
Grozing, M.4
Schaich, F.5
Wieser, N.6
-
7
-
-
0031139354
-
An improved small signal equivalent circuit model for III-V nitride MODFET's with large contact resistances
-
May
-
J. Burm, W. J. Schaff, L. F. Eastman, H. Amano, and I. Akasaki, "An improved small signal equivalent circuit model for III-V nitride MODFET's with large contact resistances," IEEE Trans Electron Devices, vol. 44, no. 5, pp. 906-907, May 1997.
-
(1997)
IEEE Trans Electron Devices
, vol.44
, Issue.5
, pp. 906-907
-
-
Burm, J.1
Schaff, W.J.2
Eastman, L.F.3
Amano, H.4
Akasaki, I.5
-
8
-
-
33749856203
-
Small-signal model of GaN HEMTs including surface charge effects
-
Rome, Italy, Nov.
-
D. Xiao, D. Schreurs, W. De Raedt, J. Derluyn, K. Vaesen, and W. Ruythooren, "Small-signal model of GaN HEMTs including surface charge effects," in Integrated Non-Linear Microwave and Millimetre-Wave Circuits Workshop, Rome, Italy, Nov. 2004, pp. 117-120.
-
(2004)
Integrated Non-Linear Microwave and Millimetre-wave Circuits Workshop
, pp. 117-120
-
-
Xiao, D.1
Schreurs, D.2
De Raedt, W.3
Derluyn, J.4
Vaesen, K.5
Ruythooren, W.6
-
9
-
-
25144487113
-
4 surface layer
-
4 surface layer," J. Appl. Phys., p. 6, 2005.
-
(2005)
J. Appl. Phys.
, pp. 6
-
-
Derluyn, J.1
Boeykens, S.2
Cheng, K.3
Vandersmissen, R.4
Das, J.5
Ruythooren, W.6
-
10
-
-
33749825355
-
Transfer from MHEMT to GaN HEMT technology: Devices and integration
-
New Orleans, LA, Apr.
-
R. Vandersmissen, W. Ruythooren, J. Das, M. Germain, D. Xiao, and D. Schreurs, "Transfer from MHEMT to GaN HEMT technology: Devices and integration," in Int. Compound Semicond. Manuf. Technol. Conf., New Orleans, LA, Apr. 2005, pp. 237-240.
-
(2005)
Int. Compound Semicond. Manuf. Technol. Conf.
, pp. 237-240
-
-
Vandersmissen, R.1
Ruythooren, W.2
Das, J.3
Germain, M.4
Xiao, D.5
Schreurs, D.6
-
11
-
-
1642627654
-
A technique for extracting small-signal equivalent-circuit elements of HEMTs
-
Nov.
-
M. Y. Jeon, B. G. Kim, Y. J. Jeon, and Y. H. Jeong, "A technique for extracting small-signal equivalent-circuit elements of HEMTs," IEICE Trans. Electron., vol. E82-C, no. 11, pp. 1968-1976, Nov. 1999.
-
(1999)
IEICE Trans. Electron.
, vol.E82-C
, Issue.11
, pp. 1968-1976
-
-
Jeon, M.Y.1
Kim, B.G.2
Jeon, Y.J.3
Jeong, Y.H.4
-
12
-
-
33645311242
-
Microwave characterization and modeling of packaged HEMTs by a direct extraction procedure down to 30 K
-
Apr.
-
A. Caddemi, G. Crupi, and N. Donato, "Microwave characterization and modeling of packaged HEMTs by a direct extraction procedure down to 30 K," IEEE Trans. Instrum. Meas., vol. 55, no. 2, pp. 465-470, Apr. 2006.
-
(2006)
IEEE Trans. Instrum. Meas.
, vol.55
, Issue.2
, pp. 465-470
-
-
Caddemi, A.1
Crupi, G.2
Donato, N.3
-
13
-
-
1642586253
-
A robust and fast procedure for the determination of the small signal equivalent circuit of HEMTs
-
May
-
A. Caddemi, G. Crupi, and N. Donato, "A robust and fast procedure for the determination of the small signal equivalent circuit of HEMTs," Microelectron. J., vol. 35, pp. 431-436, May 2004.
-
(2004)
Microelectron. J.
, vol.35
, pp. 431-436
-
-
Caddemi, A.1
Crupi, G.2
Donato, N.3
-
14
-
-
84905180028
-
A robust approach for the direct extraction of HEMT circuit elements versus bias and temperature
-
Nis, Yugoslavia, Oct.
-
A. Caddemi, N. Donato, and G. Crupi, "A robust approach for the direct extraction of HEMT circuit elements versus bias and temperature," in IEEE Int. Telecommun. Modern Satellite, Cable, Broadcast. Syst. Conf., Nis, Yugoslavia, Oct. 2003, pp. 557-560.
-
(2003)
IEEE Int. Telecommun. Modern Satellite, Cable, Broadcast. Syst. Conf.
, pp. 557-560
-
-
Caddemi, A.1
Donato, N.2
Crupi, G.3
-
15
-
-
28844484129
-
Temperature effects on DC and small signal RF performance of AlGaAs/GaAs HEMT's
-
Jan.
-
A. Caddemi, G. Crupi, and N. Donato, "Temperature effects on DC and small signal RF performance of AlGaAs/GaAs HEMT's," Microelectron. Reliab., vol. 46, pp. 169-173, Jan. 2006.
-
(2006)
Microelectron. Reliab.
, vol.46
, pp. 169-173
-
-
Caddemi, A.1
Crupi, G.2
Donato, N.3
-
16
-
-
0030258468
-
Analytical method for determining equivalent circuit parameters of GaAs FET's
-
Oct.
-
S. Yanagawa, H. Ishihara, and M. Ohtomo, "Analytical method for determining equivalent circuit parameters of GaAs FET's," IEEE Trans. Microw. Theory Tech., vol. 44, no. 10, pp. 1637-1641, Oct. 1996.
-
(1996)
IEEE Trans. Microw. Theory Tech.
, vol.44
, Issue.10
, pp. 1637-1641
-
-
Yanagawa, S.1
Ishihara, H.2
Ohtomo, M.3
-
17
-
-
85066300512
-
A new and reliable direct parasitic extraction method for MESFETs and HEMTs
-
Madrid, Spain
-
R. Tayrani, J. E. Gerber, T. Daniel, R. S. Pengelly, and U. L. Rhode, "A new and reliable direct parasitic extraction method for MESFETs and HEMTs," in Proc. 23rd Eur. Microw. Conf., Madrid, Spain, 1993, pp. 451-453.
-
(1993)
Proc. 23rd Eur. Microw. Conf.
, pp. 451-453
-
-
Tayrani, R.1
Gerber, J.E.2
Daniel, T.3
Pengelly, R.S.4
Rhode, U.L.5
-
18
-
-
0031188924
-
Very high-frequency small-signal equivalent circuit for short gate length InP HEMT's
-
Jul.
-
A. Miras and E. Legros, "Very high-frequency small-signal equivalent circuit for short gate length InP HEMT's," IEEE Trans. Microw. Theory Tech., vol. 45, no. 7, pp. 1018-1026, Jul. 1997.
-
(1997)
IEEE Trans. Microw. Theory Tech.
, vol.45
, Issue.7
, pp. 1018-1026
-
-
Miras, A.1
Legros, E.2
-
19
-
-
0030104039
-
Accurate small signal modeling of HFET's for millimeter-wave applications
-
Mar.
-
N. Rorsman, M. Garcia, C. Karlsson, and H. Zirath, "Accurate small signal modeling of HFET's for millimeter-wave applications," IEEE Trans. Microw. Theory Tech., vol. 44, no. 3, pp. 432-437, Mar. 1996.
-
(1996)
IEEE Trans. Microw. Theory Tech.
, vol.44
, Issue.3
, pp. 432-437
-
-
Rorsman, N.1
Garcia, M.2
Karlsson, C.3
Zirath, H.4
-
20
-
-
0026107986
-
Determination of intrinsic FET parameters using circuit partitioning approach
-
Feb.
-
H. O. Vickes, "Determination of intrinsic FET parameters using circuit partitioning approach," IEEE Trans. Microw. Theory Tech., vol. 39, no. 2, pp. 363-366, Feb. 1991.
-
(1991)
IEEE Trans. Microw. Theory Tech.
, vol.39
, Issue.2
, pp. 363-366
-
-
Vickes, H.O.1
-
21
-
-
0026103702
-
High frequency equivalent circuit of GaAs FET's for large-signal applications
-
Feb.
-
M. Berroth and R. Bosch, "High frequency equivalent circuit of GaAs FET's for large-signal applications," IEEE Trans. Microw. Theory Tech., vol. 39, no. 2, pp. 224-229, Feb. 1991.
-
(1991)
IEEE Trans. Microw. Theory Tech.
, vol.39
, Issue.2
, pp. 224-229
-
-
Berroth, M.1
Bosch, R.2
-
22
-
-
0031143085
-
An accurately scaled small signal model for interdigitated power P-HEMT up to 50 GHz
-
May
-
S.-W. Chen, O. Aina, W. Li, L. Phelps, and T. Lee, "An accurately scaled small signal model for interdigitated power P-HEMT up to 50 GHz," IEEE Trans. Microw. Theory Tech., vol. 45, no. 5, pp. 700-703, May 1997.
-
(1997)
IEEE Trans. Microw. Theory Tech.
, vol.45
, Issue.5
, pp. 700-703
-
-
Chen, S.-W.1
Aina, O.2
Li, W.3
Phelps, L.4
Lee, T.5
-
23
-
-
9244264946
-
Nonlinear device model of microwave power GaN HEMTs for high power-amplifier design
-
Nov.
-
P. M. Cabral, J. C. Pedro, and N. B. Carvalho, "Nonlinear device model of microwave power GaN HEMTs for high power-amplifier design," IEEE Trans. Microw. Theory Tech., vol. 52, no. 11, pp. 2585-2592, Nov. 2004.
-
(2004)
IEEE Trans. Microw. Theory Tech.
, vol.52
, Issue.11
, pp. 2585-2592
-
-
Cabral, P.M.1
Pedro, J.C.2
Carvalho, N.B.3
-
24
-
-
0035307256
-
Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures
-
Apr.
-
E. P. Vandamme, D. Schreurs, and C. van Dinther, "Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures," IEEE Trans. Electron Devices, vol. 48, no. 4, pp. 737-742, Apr. 2001.
-
(2001)
IEEE Trans. Electron Devices
, vol.48
, Issue.4
, pp. 737-742
-
-
Vandamme, E.P.1
Schreurs, D.2
Van Dinther, C.3
-
25
-
-
0035279754
-
AlGaN/GaN high electron mobility transistors on Si(111) substrates
-
Mar.
-
E. Chumbes, A. T. Schremer, J. A. Smart, Y. Wang, N. C. MacDonald, and D. Hogue, "AlGaN/GaN high electron mobility transistors on Si(111) substrates," IEEE Trans. Electron Devices, vol. 48, no. 3, pp. 420-426, Mar. 2001.
-
(2001)
IEEE Trans. Electron Devices
, vol.48
, Issue.3
, pp. 420-426
-
-
Chumbes, E.1
Schremer, A.T.2
Smart, J.A.3
Wang, Y.4
MacDonald, N.C.5
Hogue, D.6
-
26
-
-
0030149001
-
A small-signal linear equivalent circuit of HEMTs fabricated on GaAs-on-Si wafers
-
May
-
M. Goto, Y. Ohta, T. Aigo, and A. Moritani, "A small-signal linear equivalent circuit of HEMTs fabricated on GaAs-on-Si wafers," IEEE Trans. Microw. Theory Tech., vol. 44, no. 5, pp. 668-673, May 1996.
-
(1996)
IEEE Trans. Microw. Theory Tech.
, vol.44
, Issue.5
, pp. 668-673
-
-
Goto, M.1
Ohta, Y.2
Aigo, T.3
Moritani, A.4
-
27
-
-
0036076201
-
Characteristics of microwave power GaN HEMT's on 4-inch Si wafers
-
Jun.
-
S. Manohar, A. Narayanan, A. Keerti, A. Pham, J. Brown, and R. Borges, "Characteristics of microwave power GaN HEMT's on 4-inch Si wafers," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2002, pp. 449-452.
-
(2002)
IEEE MTT-S Int. Microw. Symp. Dig.
, pp. 449-452
-
-
Manohar, S.1
Narayanan, A.2
Keerti, A.3
Pham, A.4
Brown, J.5
Borges, R.6
-
28
-
-
33645301929
-
-
Ph.D. dissertation, Dept. Elect. Eng., Virginia Polytech. Inst. and State Univ., Blacksburg, VA
-
Y. A. Khalaf, "Systematic optimization technique for MESFET modeling," Ph.D. dissertation, Dept. Elect. Eng., Virginia Polytech. Inst. and State Univ., Blacksburg, VA, 2000.
-
(2000)
Systematic Optimization Technique for MESFET Modeling
-
-
Khalaf, Y.A.1
-
29
-
-
0031250249
-
GaN based heterostructure for high power devices
-
M. A. Khan, Q. Chen, M. S. Shur, B. T. Dermott, J. A. Higgins, and J. Burm, "GaN based heterostructure for high power devices," Solid State Electron., vol. 41, no. 10, pp. 1555-1559, 1997.
-
(1997)
Solid State Electron.
, vol.41
, Issue.10
, pp. 1555-1559
-
-
Khan, M.A.1
Chen, Q.2
Shur, M.S.3
Dermott, B.T.4
Higgins, J.A.5
Burm, J.6
-
30
-
-
0742321739
-
Thermal analysis of AlGaN/GaN power HFETs
-
Dec.
-
S. Nuttinck, B. K. Wagner, B. Banerjee, S. Venkataraman, E. Gebara, and J. Laskar, "Thermal analysis of AlGaN/GaN power HFETs," IEEE Trans. Microw. Theory Tech., vol. 51, no. 12, pp. 2245-2252, Dec. 2003.
-
(2003)
IEEE Trans. Microw. Theory Tech.
, vol.51
, Issue.12
, pp. 2245-2252
-
-
Nuttinck, S.1
Wagner, B.K.2
Banerjee, B.3
Venkataraman, S.4
Gebara, E.5
Laskar, J.6
-
31
-
-
0036684666
-
Determination of channel temperature in AlGaN/GaN HEMTs grown on sapphire and silicon substrates using DC characterization method
-
Aug.
-
J. Kuzmik, P. Javorka, A. Alam, M. Marso, M. Heuken, and P. Kordos, "Determination of channel temperature in AlGaN/GaN HEMTs grown on sapphire and silicon substrates using DC characterization method," IEEE Trans. Electron Devices, vol. 49, no. 8, pp. 1496-1498, Aug. 2002.
-
(2002)
IEEE Trans. Electron Devices
, vol.49
, Issue.8
, pp. 1496-1498
-
-
Kuzmik, J.1
Javorka, P.2
Alam, A.3
Marso, M.4
Heuken, M.5
Kordos, P.6
-
32
-
-
1642296149
-
Method for measuring source resistance Rs in saturation region of GaN HEMT device over bias conditions (Vgs, Vds)
-
Mar.
-
C. H. Oxley, "Method for measuring source resistance Rs in saturation region of GaN HEMT device over bias conditions (Vgs, Vds)," Electron. Lett., vol. 40, no. 5, pp. 334-346, Mar. 2004.
-
(2004)
Electron. Lett.
, vol.40
, Issue.5
, pp. 334-346
-
-
Oxley, C.H.1
-
33
-
-
0036068528
-
AlGaN/GaN HFET amplifier performance and limitations
-
Jun.
-
R. J. Trew, "AlGaN/GaN HFET amplifier performance and limitations," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2002, pp. 1811-1814.
-
(2002)
IEEE MTT-S Int. Microw. Symp. Dig.
, pp. 1811-1814
-
-
Trew, R.J.1
-
34
-
-
13344268973
-
Measurements of unity gain cutoff frequency and saturation velocity of a GaN HEMT transistor
-
Feb.
-
C. H. Oxley and M. J. Uren, "Measurements of unity gain cutoff frequency and saturation velocity of a GaN HEMT transistor," IEEE Trans. Electron Devices, vol. 52, no. 2, pp. 165-169, Feb. 2005.
-
(2005)
IEEE Trans. Electron Devices
, vol.52
, Issue.2
, pp. 165-169
-
-
Oxley, C.H.1
Uren, M.J.2
|