A robust and fast procedure for the determination of the small signal equivalent circuit of HEMTs

Microelectronics Journal

Volumn 35, Issue 5, 2004, Pages 431-436

  Caddemi, A ^a   Crupi, G ^a   Donato, N ^a  

^a UNIVERSITY OF MESSINA   (Italy)

Author keywords

Analytical elements extraction; Cold FET; Pseudomorphic HEMT; Small signal model; Temperature

Indexed keywords

CAPACITANCE; ELECTRIC RESISTANCE; INDUCTANCE; INTEGRATED CIRCUITS; INTERPOLATION; MATHEMATICAL MODELS; OPTIMIZATION; RESISTORS; SCATTERING; SEMICONDUCTOR JUNCTIONS;

ANALYTICAL ELEMENTS EXTRACTION; COLD FET; PSEUDOMORPIC HEMT; SMALL SIGNAL MODEL;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 1642586253     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2004.01.002     Document Type: Article

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