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Volumn 45, Issue 5 PART 1, 1997, Pages 700-703

An accurately scaled small-signal model for interdigitated power P-HEMT up to 50 GHz

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; MATHEMATICAL MODELS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICES;

EID: 0031143085     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.575590     Document Type: Article
Times cited : (41)

References (6)
  • 1
    • 0024738288 scopus 로고    scopus 로고
    • Modeling of noise parameters of MESFET's and MODFET's and their frequency and temperature dependence
    • vol. 37, pp. 1340-1350, Sept. 1989.
    • M. W. Pospieszalski, "Modeling of noise parameters of MESFET's and MODFET's and their frequency and temperature dependence," IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1340-1350, Sept. 1989.
    • IEEE Trans. Microwave Theory Tech.
    • Pospieszalski, M.W.1
  • 2
    • 0027846865 scopus 로고    scopus 로고
    • 12-GHz low-noise MMIC amplifier designed with a noise model that scales with MODFET size and bias
    • vol. 41, pp. 2311-2316, Dec. 1993.
    • B. Hughes and H. Kondoh, "12-GHz low-noise MMIC amplifier designed with a noise model that scales with MODFET size and bias," IEEE Trans. Microwave Theory Tech., vol. 41, pp. 2311-2316, Dec. 1993.
    • IEEE Trans. Microwave Theory Tech.
    • Hughes, B.1    Kondoh, H.2
  • 3
    • 0027837667 scopus 로고    scopus 로고
    • Improved equivalent circuit for determination of MESFET and HEMT parasitic capacitances from 'Coldfet' m measurements
    • pp. 453-154, Dec. 1993.
    • P. M. White and R. M. Healy, "Improved equivalent circuit for determination of MESFET and HEMT parasitic capacitances from 'Coldfet' m measurements," IEEE Microwave Guided Wave Lett., pp. 453-154, Dec. 1993.
    • IEEE Microwave Guided Wave Lett.
    • White, P.M.1    Healy, R.M.2
  • 4
  • 5
    • 0022665492 scopus 로고    scopus 로고
    • New method to measure the source and drain resistance of the GaAs MESFET
    • vol. EDE-7, p. 75-77, Feb. 1986.
    • E. Yang and S. I. Eong, "New method to measure the source and drain resistance of the GaAs MESFET," IEEE Electron Device Lett., vol. EDE-7, p. 75-77, Feb. 1986.
    • IEEE Electron Device Lett.
    • Yang, E.1    Eong, S.I.2
  • 6
    • 0025465290 scopus 로고    scopus 로고
    • Broad-band determination of the FET smallsignal equivalent circuit
    • vol. 38, pp. 891-895, July 1990.
    • M. Berroth and R. Bosh, "Broad-band determination of the FET smallsignal equivalent circuit," IEEE Trans. Microwave Theory Tech., vol. 38, pp. 891-895, July 1990.
    • IEEE Trans. Microwave Theory Tech.
    • Berroth, M.1    Bosh, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.