-
1
-
-
0026909944
-
-
Electronics Lett., vol. 28, no. 18, pp. 1737-1738, Aug. 1992.
-
T. Aigo. H. Yashiro, A. Jono, A. Tachikawa, and A. Moritani, Comparison of electronic characteristics and thermal resistance for HEMT's grown on GaAs and Si substrates, Electronics Lett., vol. 28, no. 18, pp. 1737-1738, Aug. 1992.
-
Comparison of Electronic Characteristics and Thermal Resistance for HEMT's Grown on GaAs and Si Substrates
-
-
Aigo, T.1
Yashiro, H.2
Jono, A.3
Tachikawa, A.4
Moritani, A.5
-
2
-
-
33747292802
-
-
Proc. 19th Int. Symp. Gallium Arsenide and Related Compounds, Sept. 28-Oct. 2, 1992, Karuizawa, Japan, pp. 881-886.
-
K. Ohtsuka and H. Nakanishi, Practical GaAs power SBD using GaAs/Si wafer, in Proc. 19th Int. Symp. Gallium Arsenide and Related Compounds, Sept. 28-Oct. 2, 1992, Karuizawa, Japan, pp. 881-886.
-
Practical GaAs Power SBD Using GaAs/Si Wafer, in
-
-
Ohtsuka, K.1
Nakanishi, H.2
-
3
-
-
0027850489
-
-
Japanese J. Appl. Physics, vol. 32, Part 1, no. 12A, pp. 5508-5513, Dec. 1993.
-
T. Aigo, H. Yashiro, M. Goto, A. Jono, A. Tachikawa, and A. Moritani, Thermal resistance and electronic characteristics for high electron mobility transistors grown on Si and GaAs substrates by metal-organic chemical vapor deposition, Japanese J. Appl. Physics, vol. 32, Part 1, no. 12A, pp. 5508-5513, Dec. 1993.
-
Thermal Resistance and Electronic Characteristics for High Electron Mobility Transistors Grown on Si and GaAs Substrates by Metal-organic Chemical Vapor Deposition
-
-
Aigo, T.1
Yashiro, H.2
Goto, M.3
Jono, A.4
Tachikawa, A.5
Moritani, A.6
-
4
-
-
0022667731
-
-
IEEE Electron Device Lett., vol. EDL-7, no. 2, pp. 112-114, Feb. 1986.
-
[4J R. J. Fischer, J. Klem, C.-K. Peng, J. S. Gedymin, and H. Markoç, Microwave properties of self-aligned GaAs/AlGaAs heterojunction bipolar transistors on silicon substrates, IEEE Electron Device Lett., vol. EDL-7, no. 2, pp. 112-114, Feb. 1986.
-
Microwave Properties of Self-aligned GaAs/AlGaAs Heterojunction Bipolar Transistors on Silicon Substrates
-
-
Fischer, J.R.J.1
Klem, J.2
Peng, C.-K.3
Gedymin, J.S.4
Markoç, H.5
-
5
-
-
0022665583
-
-
IEEE Trans. Electron Devices, vol. ED-33, no. 2, pp. 206-213, Feb. 1986.
-
R. J. Fischer, N. Chand, W. F. Kopp, C.-K. Peng, H. Markoç, K. R. Gleason, and D. Scheitlin, A DC and microwave comparison of GaAs MESFET's on GaAs and Si substrates, IEEE Trans. Electron Devices, vol. ED-33, no. 2, pp. 206-213, Feb. 1986.
-
A DC and Microwave Comparison of GaAs MESFET's on GaAs and Si Substrates
-
-
Fischer, R.J.1
Chand, N.2
Kopp, W.F.3
Peng, C.-K.4
Markoç, H.5
Gleason, K.R.6
Scheitlin, D.7
-
6
-
-
84913929175
-
-
IEEE Trans. Electron Devices, vol. ED-33, no. 10, pp. 1407-1412, Oct. 1986.
-
R. J. Fischer, W. F. Kopp, J. S. Gedymin, and H. Markoç, Properties of MODFET's grown on Si substrates at DC and microwave frequencies, IEEE Trans. Electron Devices, vol. ED-33, no. 10, pp. 1407-1412, Oct. 1986.
-
Properties of MODFET's Grown on Si Substrates at DC and Microwave Frequencies
-
-
Fischer, R.J.1
Kopp, W.F.2
Gedymin, J.S.3
Markoç, H.4
-
7
-
-
3943064255
-
-
Appl. Physics Lett., vol. 49. no. 24, pp. 1654-1655, Dec. 1986.
-
M. I. Aksun, H. Markoç, L. F. Lester, K. H. G. Duh, P. M. Smith, P. C. Chao, M. Longerbone, and L. P. Erickson, Performance of quarter-micron GaAs metal-semiconductor field-effect transistors on Si substrates, Appl. Physics Lett., vol. 49. no. 24, pp. 1654-1655, Dec. 1986.
-
Performance of Quarter-micron GaAs Metal-semiconductor Field-effect Transistors on Si Substrates
-
-
Aksun, M.I.1
Markoç, H.2
Lester, L.F.3
Duh, K.H.G.4
Smith, P.M.5
Chao, P.C.6
Longerbone, M.7
Erickson, L.P.8
-
8
-
-
0024771561
-
-
Japanese J. Appl. Physics, vol. 28, no. 11, pp. L1896-L1898, Nov. 1989.
-
|8J M. N. Charasse, B. Bartenlian, B. Gérard, J. P. Hirtz, M. Laviron, A. M. de Parscau, M. Derevonko, and D. Delagebeaudeuf, 12 GHz high power GaAs/Si MESFET's, Japanese J. Appl. Physics, vol. 28, no. 11, pp. L1896-L1898, Nov. 1989.
-
12 GHz High Power GaAs/Si MESFET's
-
-
Charasse, J.M.N.1
Bartenlian, B.2
Gérard, B.3
Hirtz, J.P.4
Laviron, M.5
De Parscau, A.M.6
Derevonko, M.7
Delagebeaudeuf, D.8
-
9
-
-
33747265454
-
-
Proc. 20th Int. Symp. Gallium Arsenide and Related Compounds, Aug. 29-Sept. 2, 1993, Freiburg, Germany, pp. 87-92.
-
T. Aigo, M. Goto, A. Jono, A. Tachikawa, and A. Moritani, Evaluation of Vth uniformities and fy for HEMT/Si fabricated using GaAs/AlGaAs selective dry etching, in Proc. 20th Int. Symp. Gallium Arsenide and Related Compounds, Aug. 29-Sept. 2, 1993, Freiburg, Germany, pp. 87-92.
-
Evaluation of Vth Uniformities and Fy for HEMT/Si Fabricated Using GaAs/AlGaAs Selective Dry Etching, in
-
-
Aigo, T.1
Goto, M.2
Jono, A.3
Tachikawa, A.4
Moritani, A.5
-
10
-
-
0344406424
-
-
Appl. Phvsics Lett., vol. 64, no. 23, pp. 3127-3129, June 1994.
-
T. Aigo, A. Jono, A. Tachikawa, R. Hiratsuka, and A. Moritani, High uniformity of threshold voltage for GaAs/AlGaAs high electron mobility transistors grown on a Si substrate, Appl. Phvsics Lett., vol. 64, no. 23, pp. 3127-3129, June 1994.
-
High Uniformity of Threshold Voltage for GaAs/AlGaAs High Electron Mobility Transistors Grown on A Si Substrate
-
-
Aigo, T.1
Jono, A.2
Tachikawa, A.3
Hiratsuka, R.4
Moritani, A.5
-
11
-
-
0023312916
-
-
Electron Device Lett., vol. EDL-8, no. 3, pp. 121-123, Mar. 1987.
-
H. Shichijo, J. W. Lee, W. V. McLevige, and A. H. Taddiken, GaAs E/D MESFET 1-kbit static RAM fabricated on silicon substrate, Electron Device Lett., vol. EDL-8, no. 3, pp. 121-123, Mar. 1987.
-
J. W. Lee, W. V. McLevige, and A. H. Taddiken, GaAs E/D MESFET 1-kbit Static RAM Fabricated on Silicon Substrate
-
-
Shichijo, H.1
-
12
-
-
0024939424
-
-
Electron Device Lett., vol. EDL-10, no. 12, pp. 559-561, Dec. 1989.
-
F. Ren, N. Chand, Y.-K. Chen, S. Pearton, D. M. Tennant, and D. J. Resnick, High-performance AlGaAs/GaAs SDHT's and ring oscillators grown by MBE on Si substrate, Electron Device Lett., vol. EDL-10, no. 12, pp. 559-561, Dec. 1989.
-
High-performance AlGaAs/GaAs SDHT's and Ring Oscillators Grown by MBE on Si Substrate
-
-
Ren, F.1
Chand, N.2
Chen, Y.-K.3
Pearton, S.4
Tennant, D.M.5
Resnick, D.J.6
-
13
-
-
0026103702
-
-
IEEE Trans. Microwave Theory Tech., vol. 39, no. 2, pp. 224-229, Feb. 1991.
-
M. Berroth and R. Busch, High-frequency equivalent circuit of GaAs FET's for large-signal applications, IEEE Trans. Microwave Theory Tech., vol. 39, no. 2, pp. 224-229, Feb. 1991.
-
High-frequency Equivalent Circuit of GaAs FET's for Large-signal Applications
-
-
Berroth, M.1
Busch, R.2
-
14
-
-
0004285428
-
-
Yoshihiro Konishi, Ed., New York: Marcel Dekker, 1991, pp. 244-245 and 267-269.
-
Yoshihiro Konishi, Ed., Microwave Integrated Circuits. New York: Marcel Dekker, 1991, pp. 244-245 and 267-269.
-
Microwave Integrated Circuits.
-
-
-
16
-
-
0026221708
-
-
IEEE Trans. Electron Devices, vol. 38, no. 9, pp. 2018-2024, Sept. 1991.
-
D. Costa, W. U. Liu, and J. S. Harris, Direct extraction of the AlGaAs/GaAs heterojunction bipolar transistor small-signal equivalent circuit, IEEE Trans. Electron Devices, vol. 38, no. 9, pp. 2018-2024, Sept. 1991.
-
Direct Extraction of the AlGaAs/GaAs Heterojunction Bipolar Transistor Small-signal Equivalent Circuit
-
-
Costa, D.1
Liu, W.U.2
Harris, J.S.3
-
17
-
-
0023576614
-
-
IEEE 1987 Bipolar Circuits Technol. Meet., 1987, pp. 70-73.
-
P. J. van Wijnen, H. R. Ciaessen, and E. A. Wolsheimer, A new straightforward calibration and correction procedure for 'on wafer' high frequency S-parameter measurements (45MHz-18GHz), in IEEE 1987 Bipolar Circuits Technol. Meet., 1987, pp. 70-73.
-
A New Straightforward Calibration and Correction Procedure for 'On Wafer' High Frequency S-parameter Measurements (45MHz-18GHz), in
-
-
Van Wijnen, P.J.1
Ciaessen, H.R.2
Wolsheimer, E.A.3
-
18
-
-
0024048518
-
-
IEEE Trans. Microwave Theory Tech., vol. 36, no. 7, pp. 1151-1159, July 1988.
-
G. Dambrine, A. Gappy, F. Heliodore, and E. Playez, A new method for determining the FET small-signal equivalent circuit, IEEE Trans. Microwave Theory Tech., vol. 36, no. 7, pp. 1151-1159, July 1988.
-
A New Method for Determining the FET Small-signal Equivalent Circuit
-
-
Dambrine, G.1
Gappy, A.2
Heliodore, F.3
Playez, E.4
-
19
-
-
0022665492
-
-
IEEE Electron Device Lett., vol. EDL-7, no. 2, pp. 75-77, Feb. 1986.
-
L. Yang and S. I. Long, New method to measure the source and drain resistance of the GaAs MESFET, IEEE Electron Device Lett., vol. EDL-7, no. 2, pp. 75-77, Feb. 1986.
-
New Method to Measure the Source and Drain Resistance of the GaAs MESFET
-
-
Yang, L.1
Long, S.I.2
-
20
-
-
0022061068
-
-
IEEE Trans. Electron Devices, vol. ED-32, no. 5, pp. 987-992, May 1985.
-
K. W. Lee, K. Lee, M. S. Shur, T. T. Vu, P. C. T. Roberts, and M. M. Helix, Source, drain, and gate series resistance and electron saturation velocity in ion-implanted GaAs FET's, IEEE Trans. Electron Devices, vol. ED-32, no. 5, pp. 987-992, May 1985.
-
K. Lee, M. S. Shur, T. T. Vu, P. C. T. Roberts, and M. M. Helix, Source, Drain, and Gate Series Resistance and Electron Saturation Velocity in Ion-implanted GaAs FET's
-
-
Lee, K.W.1
-
21
-
-
33747229436
-
-
IEEE Trans. Electron Devices, to be published.
-
T. Aigo, M. Goto, Y. Ohta, A. Jono, A. Tachikawa, and A. Moritani, Threshold voltage uniformity and characterization of microwave performance for GaAs/AlGaAs high electron-mobility transistors grown on Si substrates, IEEE Trans. Electron Devices, to be published.
-
Threshold Voltage Uniformity and Characterization of Microwave Performance for GaAs/AlGaAs High Electron-mobility Transistors Grown on Si Substrates
-
-
Aigo, T.1
Goto, M.2
Ohta, Y.3
Jono, A.4
Tachikawa, A.5
Moritani, A.6
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