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Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 7, 2006, Pages

Ion scattering simulations of the Si(100)- SiO2 interface

(4) Bongiorno, Angelo a,b,e Pasquarello, Alfredo a,b Hybertsen, Mark S c Feldman, L C d

a EPFL (Switzerland)

b INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA (Switzerland)

c Department of Earth and Environmental Sciences (United States)

d VANDERBILT UNIVERSITY (United States)

e GEORGIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33747330359 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.74.075316 Document Type: Article

Times cited : (3)

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