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Volumn 10, Issue 1, 1998, Pages

Undetectability of the Pb1 point defect as an interface state in thermal (100)Si/SiO2

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EID: 0003365089     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/10/1/003     Document Type: Article
Times cited : (63)

References (33)
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    • Brower K L 1988 Phys. Rev. B 38 9657 Brower K L 1990 Phys. Rev. B 42 3444
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    • Stesmans A 1996 Appl. Phys. Lett. 68 2723 Stesmans A 1996 Appl. Phys. Lett. 68 2076
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    • Stesmans, A.1
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    • Stesmans A 1996 Appl. Phys. Lett. 68 2723 Stesmans A 1996 Appl. Phys. Lett. 68 2076
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    • Stesmans, A.1
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    • DIMES, Delft, The Netherlands
    • DIMES, Delft, The Netherlands
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    • Griscom D L 1992 J. Electron. Matter 21 762 Nissan-Cohen Y and Gorczyca T 1988 IEEE Electron Device Lett. 9 287
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  • 33
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    • ed C R Helms and B E Deal (New York: Plenum)
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    • Edwards, A.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.