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Volumn 59, Issue 15, 1999, Pages 10132-10137
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Structure and oxidation kinetics of the si(100)-(formula presented) interface
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001540086
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.59.10132 Document Type: Article |
Times cited : (116)
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References (34)
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