Bonding Arrangements at the Si-SiO2 and SiC-SiO2 Interfaces and a Possible Origin of their Contrasting Properties

Physical Review Letters

Volumn 84, Issue 5, 2000, Pages 943-946

  Buczko, Ryszard ^a,b   Pennycook, Stephen J ^a,b   Pantelides, Sokrates T ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001743010     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.84.943     Document Type: Article

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