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Volumn 15, Issue 2, 2006, Pages

Progress of radical measurements in plasmas for semiconductor processing

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; DEPOSITION; FLUORESCENCE; INFRARED RADIATION; PLASMA ETCHING; SEMICONDUCTOR LASERS; SEMICONDUCTOR MATERIALS; SURFACE TREATMENT; THIN FILMS; ULTRAVIOLET DEVICES; VACUUM APPLICATIONS;

EID: 33646368372     PISSN: 09630252     EISSN: 13616595     Source Type: Journal    
DOI: 10.1088/0963-0252/15/2/S10     Document Type: Conference Paper
Times cited : (32)

References (78)
  • 76
    • 33646363400 scopus 로고    scopus 로고
    • 0369-8009
    • Hori M 2005 Oyo Buturi 74 at press (in Japanese)
    • (2005) Oyo Buturi , vol.74
    • Hori, M.1
  • 78
    • 0037198348 scopus 로고    scopus 로고
    • 10.1016/S0169-4332(02)00024-7 0169-4332
    • Hori M and Goto T 2002 Appl. Surf. Sci. 192 135
    • (2002) Appl. Surf. Sci. , vol.192 , Issue.1-4 , pp. 135
    • Hori, M.1    Goto, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.