Deformation and failure in thin films/substrate systems: Methods of theoretical analysis

Applied Mechanics Reviews

Volumn 58, Issue 1-6, 2005, Pages 338-353

  Mishnaevsky Jr , Leon L ^a,b,c,d,e   Gross, Dietmar ^b  

^a UNIVERSITY OF STUTTGART   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c RUTGERS UNIVERSITY   (United States)

^d ARTS ET MÉTIERS PARISTECH   (France)

^e CHINA UNIVERSITY OF MINING AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLE THIN FILMS; CRACK PATTERNS; DISLOCATION FORMATION;

CRACK PROPAGATION; DEFORMATION; MATHEMATICAL MODELS; STRENGTH OF MATERIALS; SUBSTRATES;

THIN FILMS;

EID: 32044435182     PISSN: 00036900     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1995717     Document Type: Conference Paper

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